| 2004 | Security vs. Test Quality: Fully Embedded Test Approaches Are the Key to Having Both. | Stephen Pateras |
| 2004 | Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. | Chintan Patel, Abhishek Singh, Jim Plusquellic |
| 2004 | Board Test Coverage Needs to be Standardized. | Kenneth P. Parker |
| 2004 | A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. | Kenneth P. Parker |
| 2004 | A Critical Path Selection Method for Delay Testing. | Saravanan Padmanaban, Spyros Tragoudas |
| 2004 | Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed? | Yukio Okuda |
| 2004 | Precise Pulse Width Measurement in Write Pre-compensation Test. | Hideo Okawara |
| 2004 | A Hierarchical DFT Architecture for Chip, Board and System Test/Debug. | Charles Njinda |
| 2004 | DFT for Test Optimisations in a Complex Mixed-Signal SOC - Case Study on TI's TNETD7300 ADSL Modem Device. | K. Nikila, Rubin A. Parekhji |
| 2004 | How long can we succeed using the OBIRCH and its derivatives? | Kiyoshi Nikawa |
| 2004 | Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. | Phil Nigh, Anne E. Gattiker |
| 2004 | Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". | Phil Nigh |
| 2004 | Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. | Phil Nigh |
| 2004 | Functional Test Coverage Effectiveness on the Decline. | Jay J. Nejedlo |
| 2004 | Cost of Test - Taking Control. | Nilanjan Mukherjee |
| 2004 | I/O Self-Leakage Test. | Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor |
| 2004 | Fault Diagnosis in Designs with Convolutional Compactors. | Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski |
| 2004 | X-Tolerant Signature Analysis. | Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher |
| 2004 | Towards Microagent based DBIST/DBISR. | Liviu Miclea, Szilrd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto |
| 2004 | Test Strategy Cost Model Innovations. | Carlos Michel, Rosa D. Reinosa |
| 2004 | Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing. | Cecilia Metra, T. M. Mak, Martin Omaa |
| 2004 | A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis. | Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal |
| 2004 | Controlled Sine Wave Fitting for ADC Test. | Heinz Mattes, Claus Dworski, Sebastian Sattler |
| 2004 | Localizing Open Interconnect Defects using Targeted Routing in FPGA's. | Dave Mark, Jenny Fan |
| 2004 | Security vs. Test Quality: Can We Really Only Have One at a Time? | Erik Jan Marinissen |