| 2003 | Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs. | Miroslav N. Velev |
| 2003 | Design Verification Problems: Test To The Rescue? | Prab Varma |
| 2003 | First IC Validation of IEEE Std. 1149.6. | Suzette Vandivier, Mark Wahl, Jeff Rearick |
| 2003 | Elimination of Traditional Functional Testing of Interface Timings at Intel. | Mike Tripp, T. M. Mak, Anne Meixner |
| 2003 | On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures. | Ramesh C. Tekumalla |
| 2003 | On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs. | Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz |
| 2003 | Building An RF Source For Low Cost Testers Using An ADPLL Controlled By Texas Instruments Digital Signal Processor (DSP) TMS320C5402. | Iboun Taimiya Sylla |
| 2003 | RIC/DICMOS - Multi-channel CMOS Formatter. | Ahmed Rashid Syed |
| 2003 | Testing of Droplet-Based Microelectrofluidic Systems. | Fei Su, Sule Ozev, Krishnendu Chakrabarty |
| 2003 | Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus. | Stephen K. Sunter |
| 2003 | A Generic Test Path and DUT Model for DataCom ATE. | Jie Sun, Mike Li |
| 2003 | Test Vector Generation Based on Correlation Model for Ratio-Iddq. | Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
| 2003 | BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study. | Charles E. Stroud, Keshia N. Leach, Thomas A. Slaughter |
| 2003 | Concurrent Error Detection in Linear Analog Circuits Using State Estimation. | Haralampos-G. D. Stratigopoulos, Yiorgos Makris |
| 2003 | Optical and Electrical Testing of Latchup in I/O Interface Circuits. | Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda |
| 2003 | PXI - A New Architecture for Many Testing Requirements. | Bob Stasonis |
| 2003 | The PXI Modular Instrumentation Architecture. | Eric Starkloff, Tim Fountain, Garth Black |
| 2003 | Future ATE: Perspectives & Requirements. | Lee Y. Song |
| 2003 | Selecting PXI Architecture for Board (System) Functional Test. | Eric L. Smitt |
| 2003 | RF Test 101: Defining the Problem, Finding Solutions. | Mustapha Slamani |
| 2003 | Next-Generation Devices and Networks Bring Opportunities and Challenges. | Antti Sivula |
| 2003 | XML And Java For Open ATE Programming Environment. | A. T. Sivaram, Daniel Fan, Jon Pryce |
| 2003 | Should Nanometer Circuits be Periodically Tested in the Field? | Adit D. Singh |
| 2003 | Modeling Scan Chain Modifications For Scan-in Test Power Minimization. | Ozgur Sinanoglu, Alex Orailoglu |
| 2003 | Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. | Zhen Shi, Peter Sandborn |