| 2003 | Periodic Jitter Injection with Direct Time Synthesis by SPPTM ATE for SerDes Jitter Tolerance Test in Production. | Masashi Shimanouchi |
| 2003 | Fault Injection for Verifying Testability at the VHDL Level. | S. R. Seward, Parag K. Lala |
| 2003 | Burn-in Temperature Projections for Deep Sub-micron Technologies. | Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins |
| 2003 | Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. | Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning |
| 2003 | Managing the Multi-Gbit/s Test Challenges. | Ulrich Schoettmer, Bernd Laquai |
| 2003 | A Case Study of IR-Drop in Structured At-Speed Testing. | Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger |
| 2003 | A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation. | Nobuhiro Sato, Yoshihiro Hashimoto |
| 2003 | Testing 3G-controlled systems: time to rejoice or time to feel pain? | Moray Rumney |
| 2003 | Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA). | Jeremy A. Rowlette, Travis M. Eiles |
| 2003 | Test Outsourcing - A Subcontract Manufacturer's Perspective. | John Roberts |
| 2003 | Board Test Coverage: The Value of Prediction and How to Compare Numbers. | Wouter Rijckaert, Frans G. M. de Jong |
| 2003 | Convolutional Compaction of Test Responses. | Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy |
| 2003 | Test Challenges of Nanometer Technology. | Janusz Rajski |
| 2003 | An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit. | Wangqi Qiu, D. M. H. Walker |
| 2003 | BIST for Deep Submicron ASIC Memories with High Performance Application. | Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Omer Samman, Paul Policke, Sherry Lai |
| 2003 | Key Impediments to DFT-Focused Test and How to Overcome Them. | Kenneth E. Posse, Geir Eide |
| 2003 | EEPROM Memory: Threshold Voltage Built In Self Diagnosis. | Jean-Michel Portal, Hassen Aziza, Didier Ne |
| 2003 | Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains. | Irith Pomeranz |
| 2003 | Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. | Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski |
| 2003 | Automatic Diagnostic Program Generation for Mixed Signal Load Board. | Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam |
| 2003 | Board Life-Cycle Testing For Effective NPI Management of Wireless Products. | Timo Piironen |
| 2003 | Improving Wireless Product Testing: An Opportunity for University and Industry Collaboratio. | Jim Paviol |
| 2003 | Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? | Kenneth P. Parker |
| 2003 | Panel Synopsis - How (In)Adequate is One Time Testing? | Rubin A. Parekhji |
| 2003 | Novel Transient Fault Hardened Static Latch. | Martin Omaa, Daniele Rossi, Cecilia Metra |