| 2003 | Hysteresis of Intrinsic IDDQ Currents. | Yukio Okuda, Nobuyuki Furukawa |
| 2003 | Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results. | Yoshihito Nishizaki, Osamu Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura |
| 2003 | The Increasing Importance of On-line Testing to Ensure High-Reliability Products. | Phil Nigh |
| 2003 | Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives. | Michael Nicolaidis |
| 2003 | Future ATE for System on a Chip... Some Perspectives. | Tom Newsom |
| 2003 | IBISTTM (Interconnect Built-in Self-Test) Architecture and Methodology for PCI Express: Intel?s Next-Generation Test and Validation Methodology for Performance IO. | Jay J. Nejedlo |
| 2003 | TRIBuTETM Board and Platform Test Methodology: Intel's Next-Generation Test and Validation Methodology for Platforms. | Jay J. Nejedlo |
| 2003 | On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. | Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2003 | Diagnosis in Modern Design - Just the Tip of the Iceberg. | Fidel Muradali |
| 2003 | Future ATE: Perspectives & Requirements. | Fidel Muradali |
| 2003 | MEMS Design And Verification. | Tamal Mukherjee |
| 2003 | Debug and Diagnosis in the Age of System-on-a-Chip. | Robert F. Molyneaux |
| 2003 | Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits. | Kartik Mohanram, Nur A. Touba |
| 2003 | Defect Tolerance at the End of the Roadmap. | Mahim Mishra, Seth Copen Goldstein |
| 2003 | Agent Based DBIST/DBISR And Its Web/Wireless Management. | Liviu Miclea, Szilrd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto |
| 2003 | A Comprehensive Approach to Assessing and Analyzing 1149.1 Test Logic. | Kevin Melocco, Hina Arora, Paul Setlak, Gary Kunselman, Shazia Mardhani |
| 2003 | The Testability Features of The ARM1026EJ Microprocessor Core. | Teresa L. McLaurin, Frank Frederick, Rich Slobodnik |
| 2003 | Method of reducing contactor effect when testing high-precision ADCs. | Gwenol Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy |
| 2003 | MEMS Manufacturing Testing: An Accelerometer Case Study. | Theresa Maudie, Alex Hardt, Rick Nielsen, Dennis Stanerson, Ron Bieschke, Mike Miller |
| 2003 | Deformations of IC Structure in Test and Yield Learning. | Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey |
| 2003 | DFM - An Industry Paradigm Shift. | Cliff Ma |
| 2003 | An extension to JTAG for at-speed debug on a system. | Leon van de Logt, Frank van der Heyden, Tom Waayers |
| 2003 | A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. | Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow |
| 2003 | CMOS Built-In Test Architecture for High-Speed Jitter Measurement. | Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz |
| 2003 | Deterministic BIST Based on a Reconfigurable Interconnection Network. | Lei Li, Krishnendu Chakrabarty |