| 2003 | Requirements, Challenges, And Solutions For Testing Multiple GB/s ICs In Production. | Mike Li |
| 2003 | Production Test Challenges And Possible Solutions For Multiple GB/s ICs. | Mike Li |
| 2003 | A Reconfigurable Power-Conscious Core Wrapper and its Application to SOC Test Scheduling. | Erik Larsson, Zebo Peng |
| 2003 | Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk. | Rahul Kundu, R. D. (Shawn) Blanton |
| 2003 | On-line Detection of Faults in Carry-Select Adders. | B. Kiran Kumar, Parag K. Lala |
| 2003 | Detection of Resistive Shorts in Deep Sub-micron Technologies. | Bram Kruseman, Stefan van den Oetelaar |
| 2003 | Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak |
| 2003 | Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. | Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian |
| 2003 | DFFT : Design For Functional Testability. | Haluk Konuk, Leon Xiao |
| 2003 | Testing Challenges of Future Wireless World. | Tapio Koivukangas |
| 2003 | Testing 3G-controlled systems: time to rejoice or time to feel pain? | Tapio Koivukangas |
| 2003 | A New Maximal Diagnosis Algorithm for Bus-structured Systems. | YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang |
| 2003 | DFM - A Fabless Perspective. | Jitendra Khare |
| 2003 | A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. | David C. Keezer, Dany Minier, Marie-Christine Caron |
| 2003 | Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers. | Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga |
| 2003 | Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. | Ramesh Karri, Grigori Kuznetsov, Michael Gssel |
| 2003 | Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. | Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel |
| 2003 | Towards Structural Testing of Superconductor Electronics. | Arun A. Joseph, Hans G. Kerkhoff |
| 2003 | IEEE P1581: To Live or Let die? | Frans G. M. de Jong, Leon van de Logt |
| 2003 | Ultra Low Cost Linear Testing. | Michael A. Jones |
| 2003 | Cost Containment for High-Volume Test of Multi-GB/s Ports. | John C. Johnson |
| 2003 | Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. | Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger |
| 2003 | Effectiveness Improvement of ECR Tests. | Wanli Jiang, Eric Peterson, Bob Robotka |
| 2003 | A BIST Solution for The Test of I/O Speed. | Cheng Jia, Linda S. Milor |
| 2003 | Race: A Word-Level ATPG-Based Constraints Solver System For Smart Random Simulation. | Mahesh A. Iyer |