| 2003 | Diagnosis in Modern Design to Volume - The Tip of the Iceberg. | William V. Huott |
| 2003 | Test-Based Model Generation For Legacy Systems. | Hardi Hungar, Tiziana Margaria, Bernhard Steffen |
| 2003 | Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault. | Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-Ju Hsieh, Yu-Ting Hung |
| 2003 | Optimal Interconnect ATPG Under a Ground-Bounce Constraint. | Henk D. L. Hollmann, Erik Jan Marinissen, Bart Vermeulen |
| 2003 | Circular BIST testing the digital logic within a high speed Serdes. | Graham Hetherington, Richard Simpson |
| 2003 | Coverage-Directed Management and Optimization of Random Functional Verification. | Amir Hekmatpour, James Coulter |
| 2003 | Hybrid Multisite Testing at Manufacturing. | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi |
| 2003 | The Confluence of Manufacturing Test and Design Validation. | Ian G. Harris |
| 2003 | Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. | Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2003 | VDD Ramp Testing for RF Circuits. | Jos Pineda de Gyvez, Guido Gronthoud, Rashid Amine |
| 2003 | High Quality ATPG for Delay Defects. | Puneet Gupta, Michael S. Hsiao |
| 2003 | Analog Circuit Test using Transfer Function Coe .cient Estimates. | Zhen Guo, Jacob Savir |
| 2003 | Backplane Test Bus Applications For IEEE STD 1149.1. | Clayton Gibbs |
| 2003 | Data flow within an open architecture tester. | Maurizio Gavardoni |
| 2003 | The Confluence of Manufacturing Test and Design Validation. | Franco Fummi |
| 2003 | Infrastructure IP for Back-End Yield Improvement. | L. Forli, Jean-Michel Portal, Didier Ne, Bertrand Borot |
| 2003 | Architecting Millisecond Test Solutions for Wireless Phone RFIC's. | John Ferrario, Randy Wolf, Steve Moss |
| 2003 | Application of Built in Self-Test for Interconnect Testing of FPGAs. | Dereck A. Fernandes, Ian G. Harris |
| 2003 | MEMS Fabrication. | Gary K. Fedder |
| 2003 | Case Study - Using STIL as Test Pattern Language. | Daniel Fan, Steve Roehling, Rusty Carruth |
| 2003 | Testability Features of the Alpha 21364 Microprocessor. | Scott Erlanger, Dilip K. Bhavsar, Richard A. Davies |
| 2003 | Simulating Resistive Bridging and Stuck-At Faults. | Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker |
| 2003 | IEEE 1149.6 - A Practical Perspective. | Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz |
| 2003 | Improving Wireless Product Testing via University and Industry Collaboration. | William R. Eisenstadt |
| 2003 | Open Microphone - My DFT is better than yours ... | Geir Eide, Kenneth E. Posse |