| 2003 | Design for Manufacturability - or the meaning of 'subtle'. | Stefan Eichenberger |
| 2003 | How (In)Adequate is One-time Testing. | Peter Ehlig |
| 2003 | Design and Implementation of IEEE 1149.6. | Ivan Duzevik |
| 2003 | Fault Localization using Time Resolved Photon Emission and STIL Waveforms. | Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah |
| 2003 | Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. | John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman |
| 2003 | Overview of the IEEE P1500 Standard. | Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur |
| 2003 | Latch Divergency In Microprocessor Failure Analysis. | Peter Dahlgren, Paul Dickinson, Ishwar Parulkar |
| 2003 | Power-aware NoC Reuse on the Testing of Core-based Systems. | rika F. Cota, Luigi Carro, Flvio Rech Wagner, Marcelo Lubaszewski |
| 2003 | Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing. | Kun Young Chung, Sandeep K. Gupta |
| 2003 | FPGA Interconnect Delay Fault Testing. | Erik Chmelar |
| 2003 | Silicon Diagnosis. | Wu-Tung Cheng |
| 2003 | The Confluence of Manufacturing Test and Design Validation. | Kwang-Ting Cheng |
| 2003 | Seamless Research Between Academia And Industry To Facilitate Test Of Integrated High-Speed Wireless Systems: Is This An Illusion? | Abhijit Chatterjee |
| 2003 | Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. | Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan |
| 2003 | Jitter Test in Production for High Speed Serial Links. | Yi Cai |
| 2003 | Outlier Detection for DPPM Reduction. | Paul Buxton, Paul Tabor |
| 2003 | Standards Based Wireless Device Testing. | John D. Bowne |
| 2003 | Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. | Yannick Bonhomme, Patrick Girard, Los Guiller, Christian Landrault, Serge Pravossoudovitch |
| 2003 | Analyzing the Effectiveness of Multiple-Detect Test Sets. | R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah |
| 2003 | Double-Tree Scan: A Novel Low-Power Scan-Path Architecture. | Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang |
| 2003 | A New Methodology For ADC Test Flow Optimization. | Serge Bernard, Mariane Comte, Florence Azas, Yves Bertrand, Michel Renovell |
| 2003 | Impact of Multiple-Detect Test Patterns on Product Quality. | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | Data Critically Estimation In Software Applications. | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri |
| 2003 | Self-Testing and Self-Healing via Mobile Agents. | Alfredo Benso |
| 2003 | Relating Yield Models to Burn-In Fall-Out in Time. | Thomas S. Barnett, Adit D. Singh |