| 2003 | Challenges in Low Cost Test Approach for ARM9TM Core Based Mixed-Signal SoC DragonBallTM-MX1. | George Bao |
| 2003 | Constructive Pattern Generation Heuristic for Meeting SSO Limits. | Kendrick Baker |
| 2003 | HyAC: A Hybrid Structural SAT Based ATPG for Crosstalk. | Xiaoliang Bai, Sujit Dey, Angela Krstic |
| 2003 | Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. | Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante |
| 2003 | CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. | Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura |
| 2003 | Silicon IP And Successful DFM. | Robert C. Aitken |
| 2003 | DFM: The Real 90nm Hurdle. | Robert C. Aitken |
| 2003 | Fault Collapsing via Functional Dominance. | Vishwani D. Agrawal, A. V. S. S. Prasad, Madhusudan V. Atre |
| 2003 | Impedance Profile of a Commercial Power Grid and Test System. | Dhruva Acharyya, Jim Plusquellic |
| 2002 | Embedded Memory Test and Repair: Infrastructure IP for SOC Yield. | Yervant Zorian |
| 2002 | On-Line Testing of Multi-Source Noise-Induced Errors on the Interconnects and Buses of System-on-Chips. | Yi Zhao, Li Chen, Sujit Dey |
| 2002 | A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter. | Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie |
| 2002 | Multi-GHz interface devices should be tested using external test resources. | Takahiro J. Yamaguchi |
| 2002 | Trouble With Scan. | David M. Wu |
| 2002 | Multiscan-Based Test Compression and Hardware Decompression Using LZ77. | Francis G. Wolff, Christos A. Papachristou |
| 2002 | System Manufacturing Test Cost Model. | David Williams, Anthony P. Ambler |
| 2002 | Test Coverage Models for System Test? | David Williams |
| 2002 | Inevitable Use of TAP Domains in SOCs. | Lee Whetsel |
| 2002 | Open ATE Architecture: Key Challenges. | Burnell G. West |
| 2002 | Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. | Carsten Wegener, Michael Peter Kennedy |
| 2002 | What a Device Interface Board Really Costs: An Evaluation of Technical Considerations for Testing Products Operating in the Gigabit Region. | Thomas P. Warwick |
| 2002 | On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. | Li-C. Wang, Magdy S. Abadir, Juhong Zhu |
| 2002 | Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. | Seongmoon Wang |
| 2002 | Packet-Based Input Test Data Compression Techniques. | Erik H. Volkerink, Ajay Khoche, Subhasish Mitra |
| 2002 | Good Scan = Good Quality Level? Well, It Depends ? | Anjali Kinra Vij |