| 2002 | Core-Based Scan Architecture for Silicon Debug. | Bart Vermeulen, Tom Waayers, Sandeep Kumar Goel |
| 2002 | EEE 1149.1-Compliant Access Architecture for Multiple Core Debug on Digital System Chips. | Bart Vermeulen, Tom Waayers, Sjaak Bakker |
| 2002 | TAPS All Over My Chips! So Now What Do I Do? | Bart Vermeulen |
| 2002 | Design Rewiring Using ATPG. | Andreas G. Veneris, Magdy S. Abadir, Mandana Amiri |
| 2002 | Isolating and Removing Sources of Variation in Test Data. | David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge |
| 2002 | Test and Repair of Nonvolatile Commodity and Embedded Memories. | Shigeo Tsuchida |
| 2002 | On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms). | Mike Tripp |
| 2002 | FPGA Test and Coverage. | Shahin Toutounchi, Andrew Lai |
| 2002 | A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. | Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo |
| 2002 | On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis. | Ramesh C. Tekumalla, Scott Davidson |
| 2002 | Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor. | Mohammad H. Tehranipour, Mehrdad Nourani |
| 2002 | Fault Grading FPGA Interconnect Test Configurations. | Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey |
| 2002 | An Embedded Core for Sub-Picosecond Timing Measurements. | Sassan Tabatabaei, Andr Ivanov |
| 2002 | R4X/D4X - Formatters for Flexible Test System Architecture. | Ahmed Rashid Syed |
| 2002 | Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. | Stephen K. Sunter, Benoit Nadeau-Dostie |
| 2002 | IC Mixed-Signal BIST: Separating Facts from Fiction. | Stephen K. Sunter |
| 2002 | BIST-Based Diagnosis of FPGA Interconnect. | Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici |
| 2002 | An Implementation of IEEE 1149.1 to Avoid Timing Violations and Other Practical In-Compliance Improvements. | Dave Stang, Ramaswami Dandapani |
| 2002 | A New Test Generation Approach for Embedded Analogue Cores in SoC. | M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff |
| 2002 | Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. | Gregory S. Spirakis |
| 2002 | Mixed Signal BIST: Fact or Fiction. | Lee Y. Song |
| 2002 | A Wavelet-Based Timing Parameter Extraction Method. | Mani Soma, Welela Haileselassie, Jessica Yan, Rajesh Raina |
| 2002 | Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? | Mustapha Slamani |
| 2002 | Efficient Embedded Memory Testing with APG. | A. T. Sivaram, Daniel Fan, A. Yiin |
| 2002 | DUT Capture Using Simultaneous Logic Acquisition. | A. T. Sivaram, William Fritzsche, Toshitaka Koshi, Nam Lai |