| 2003 | H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. | David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish |
| 2003 | Register Transfer Level Approach to Hybrid Time and Hardware Redundancy Based Fault Secure Datapath Synthesis. | Kaijie Wu, Ramesh Karri |
| 2003 | Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal. | Qingwei Wu, Michael S. Hsiao |
| 2003 | Transistor-Level Fault Analysis and Test Algorithm Development for Ternary Dynamic Content Addressable Memorie. | Derek Wright, Manoj Sachdev |
| 2003 | X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. | Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin |
| 2003 | Designed -in-diagnostics: A new optical method. | Keneth R. Wilsher |
| 2003 | Adapting JTAG for AC Interconnect Testing. | Lee Whetsel |
| 2003 | ATE-Customer Perspectives & Requirements Panel. | Donald L. Wheater |
| 2003 | Multi-GB/s IC Test Challenges and Solutions. | Burnell G. West |
| 2003 | Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy. | Burnell G. West |
| 2003 | PXI: A Solution For Board Functional Test? | Jim Webster |
| 2003 | Mitigating the Effects of The DUT Interface board and Test System Parasitics in Gigabit-Plus Measurements. | Thomas P. Warwick |
| 2003 | An Efficient and Effective Methodology on the Multiple Fault Diagnosis. | Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski |
| 2003 | Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. | Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir |
| 2003 | Fault Pattern Oriented Defect Diagnosis for Memories. | Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang |
| 2003 | A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. | Seongmoon Wang, Srimat T. Chakradhar |
| 2003 | Future Challenges for MEMS Failure Analysis. | Jeremy A. Walraven |
| 2003 | Tools and Techniques for Failure Analysis and Qualification of MEMS. | Jeremy A. Walraven |
| 2003 | Failure Mechanisms in MEMS. | Jeremy A. Walraven |
| 2003 | Introduction to Applications and Industries for Microelectromechanical Systems (MEMS). | Jeremy A. Walraven |
| 2003 | The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. | Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod |
| 2003 | An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips. | Tom Waayers |
| 2003 | ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. | Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink |
| 2003 | Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. | Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee |
| 2003 | Progressive Bridge Identification. | Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton |