| 2002 | The Role of Test in a Highly Outsourced Business Model. | Bill Price |
| 2002 | A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets. | A. V. S. S. Prasad, Vishwani D. Agrawal, Madhusudan V. Atre |
| 2002 | An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. | Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Ne |
| 2002 | Verification of Device Interface Hardware Interconnections Prior to the Start of Testing. | Guy Peterson |
| 2002 | The Consequences of an Open ATE Architecture. | Sergio M. Perez |
| 2002 | Testing CrossTalk Induced Delay Faults in Static CMOS Circuits Through Dynamic Timing Analysis. | Bipul Chandra Paul, Kaushik Roy |
| 2002 | FRITS - A Microprocessor Functional BIST Method. | Praveen Parvathala, Kaila Maneparambil, William Lindsay |
| 2002 | A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC | Ishwar Parulkar, Thomas A. Ziaja, Rajesh Pendurkar, Anand D'Souza, Amitava Majumdar |
| 2002 | Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems. | Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir |
| 2002 | Board Test Is NOT Mature. | Kenneth P. Parker |
| 2002 | Test Time Impact of Redundancy Repair in Embedded Flash Memory. | Paul Okino |
| 2002 | CMOS Circuit Technology for Precise GHz Timing Generator. | Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto |
| 2002 | Frequency/Phase Movement Analy i by Orthogonal Demodulation. | Hideo Okawara |
| 2002 | TAPs All Over My Chips. | Steven F. Oakland |
| 2002 | Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. | Phil Nigh |
| 2002 | XIDEN: Crosstalk Target Identification Framework. | Shahin Nazarian, Hang Huang, Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 2002 | Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores. | Mohsen Nahvi, Andr Ivanov, Resve A. Saleh |
| 2002 | The Impact of Outsourcing on Test. | Fidel Muradali |
| 2002 | Outsourcing Test without Standards? | Peter Muhmenthaler |
| 2002 | X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. | Subhasish Mitra, Kee Sup Kim |
| 2002 | Itelligent Agents and BIST/BISR - Working Together in Distributed Systems. | Liviu Miclea, Szilrd Enyedi, Alfredo Benso |
| 2002 | Clock Faults? Impact on Manufacturing Testing and Their Possible Detection Through On-Line Testing. | Cecilia Metra, Stefano Di Francescantonio, T. M. Mak |
| 2002 | TAPS All Over My Chips. | Teresa L. McLaurin |
| 2002 | The Process and Challenges of a High-Speed DUT Board Project. | David E. McFeely |
| 2002 | Realizing the Benefits of Structural Test for Intel Microprocessors. | Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp |