| 2002 | Wafer/Package Test Mix for Optimal Defect Detection. | Peter C. Maxwell |
| 2002 | The Heisenberg Uncertainty of Test. | Peter C. Maxwell |
| 2002 | Considerations for STIL Data Application. | Gregory A. Maston |
| 2002 | A Set of Benchmarks fo Modular Testing of SOCs. | Erik Jan Marinissen, Vikram Iyengar, Krishnendu Chakrabarty |
| 2002 | High Current DPS Architecture for Sort Test Challenge. | Jean-Pascal Mallet |
| 2002 | A Multi-Language Goal-Tree Based Functional Test Planning System. | Rajneesh Mahajan, Ramesh Govindarajulu, James R. Armstrong, F. Gail Gray |
| 2002 | Screening MinVDD Outliers Using Feed-Forward Voltage Testing. | Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner |
| 2002 | Testing Wireless Local Area Network Transceiver ICs at 5 GHz. | Kevin M. MacKay |
| 2002 | Panel: "Board Test and ITC: What Does the Future Hold?". | Monica Lobetti Bodoni |
| 2002 | On the Accuracy of Jitter Separation from Bit Error Rate Function. | Mike Peng Li, Jan B. Wilstrup |
| 2002 | Incremental Diagnosis of Multiple Open-Interconnects. | Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi |
| 2002 | Techniques to Reduce Data Volume and Application Time for Transition Test. | Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran |
| 2002 | Support for Debugging in the Alpha 21364 Microprocessor. | Timothe Litt |
| 2002 | Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2002 | Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis. | David B. Lavo, Ismed Hartanto, Tracy Larrabee |
| 2002 | Comparison of IDDQ Testing and Very-Low Voltage Testing. | Bram Kruseman, Stefan van den Oetelaar, Josep Rius |
| 2002 | Improved Digital I/O Ports Enhance Testability of Interconnections. | Adam Kristof |
| 2002 | Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression. | C. V. Krishna, Nur A. Touba |
| 2002 | Test Setup Simulation - A High-Performance VHDL-Based Virtual Test Solution Meeting Industrial Requirements. | Gunter Krampl, Marco Rona, Hermann Tauber |
| 2002 | On the Use of k-tuples for SoC Test Schedule Representation. | Sandeep Koranne, Vikram Iyengar |
| 2002 | Challenges and Solutions for Multi-Gigahertz Testing. | David C. Keezer |
| 2002 | Low-Contact-Force Probing on Copper Electrodes. | Kenichi Kataoka, Toshihiro Itoh, Katsuya Okumura, Tadatomo Suga |
| 2002 | Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. | Bozena Kaminska |
| 2002 | Wireless SOC Testing: Can RF Testing Costs Be Reduced? | Alan Kafton |
| 2002 | The Manic Depression of Microprocessor Debug. | Don Douglas Josephson |