| 2002 | Use of Pipeline Converters for ATE Applications. | Maurizio Gavardoni |
| 2002 | valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. | John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns |
| 2002 | A/MS BISTs: The FACTS, Just the Facts. | Arnold Frisch |
| 2002 | Architecting Millisecond Test Solutions for Wireless Phone RFIC's. | John Ferrario, Randy Wolf, Steve Moss |
| 2002 | IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. | Bill Eklow, Carl Barnhart, Kenneth P. Parker |
| 2002 | Is Board Test Worth Talking About? | Bill Eklow |
| 2002 | Robustness IPs for Reliability and Security of SoCs. | Eric Dupont, Michael Nicolaidis |
| 2002 | Adapting an SoC to ATE Concurrent Test Capabilities. | Rainer Dorsch, Ramn Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer |
| 2002 | Built-In Self Test of CMOS-MEMS Accelerometers. | Nilmoni Deb, R. D. (Shawn) Blanton |
| 2002 | Multi-Purpose Digital Test Core Utilizing Programmable Logic. | John S. Davis, David C. Keezer |
| 2002 | What Can IC Test Teach System Test? | Scott Davidson |
| 2002 | Managing in the ATE Business - Postcards from the Past, Lessons for the Future. | Alex d'Arbeloff |
| 2002 | Test and Repair of Embedded Flash Memories. | Jean Michel Daga |
| 2002 | Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. | W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |
| 2002 | Testing the Tester: What Broke? Where? When? Why? | Alfred L. Crouch |
| 2002 | An Integrated Approach to Yield Loss Characterization. | Mark Craig, Alvin Jee, Prashant Maniar |
| 2002 | On-Chip Repair and an ATE Independent Fusing Methodology. | Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater |
| 2002 | Mission Impossible? Open Architecture ATE. | Dennis R. Conti |
| 2002 | A Structured Graphical Tool for Analyzing Boundary Scan Violations. | Michael Cogswell, Shazia Mardhani, Kevin Melocco, Hina Arora |
| 2002 | Diagonal Test and Diagnostic Schemes for Flash Memorie. | Sau-Kwo Chiu, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu |
| 2002 | A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
| 2002 | Experimental Evaluation of Scan Tests for Bridges. | Sreejit Chakravarty, Ankur Jain, Nandakumar Radhakrishnan, Eric W. Savage, Sujit T. Zachariah |
| 2002 | A Novel Fault Injection Method for System Verification Based on FPGA Boundary Scan Architectur. | Tapan J. Chakraborty, Chen-Huan Chiang |
| 2002 | Jitter Testing for Multi-Gigabit Backplane SerDes - Techniques to Decompose and Combine Various Types of Jitter. | Yi Cai, S. A. Werner, G. J. Zhang, Max J. Olsen, Robert D. Brink |
| 2002 | Is ITC Bored with Board Test? | Kenneth M. Butler |