| 2001 | Switch-level delay test of domino logic circuits. | Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 2001 | Test challenges for SONET/SDH physical layer OC3 devices and beyond. | Udaya Natarajan |
| 2001 | A phase noise spectrum test solution for high volume mixed signal/wireless automatic test equipments. | Hui S. Nam, Bernard Cuddy, Dieter Luecking |
| 2001 | Test cost reduction by at-speed BISR for embedded DRAMs. | Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada |
| 2001 | Automated translation of legacy code for ATE. | Andrew Moran, Jim Teisher, Andrew Gill, Emir Pasalic, John Veneruso |
| 2001 | Unit level predicted yield: a method of identifying high defect density die at wafer sort. | Russell B. Miller, Walter C. Riordan |
| 2001 | On-line testing of transient and crosstalk faults affecting interconnections of FPGA-implemented systems. | Cecilia Metra, Andrea Pagano, Bruno Ricc |
| 2001 | Test and repair of large embedded DRAMs. I. | Roderick McConnell, Rochit Rajsuman, Eric A. Nelson, Jeffrey H. Dreibelbis |
| 2001 | Ramp testing of ADC transition levels using finite resolution ramps. | Solomon Max |
| 2001 | Rapid-response temperature control provides new defect screening opportunities. | Mark Malinoski, Burnell G. West |
| 2001 | On static test compaction and test pattern ordering for scan designs. | Xijiang Lin, Janusz Rajski, Irith Pomeranz, Sudhakar M. Reddy |
| 2001 | March-based RAM diagnosis algorithms for stuck-at and coupling faults. | Jin-Fu Li, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu |
| 2001 | Two-dimensional test data compression for scan-based deterministic BIST. | Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2001 | Making cause-effect cost effective: low-resolution fault dictionaries. | David B. Lavo, Tracy Larrabee |
| 2001 | Testing gigabit multilane SerDes interfaces with passive jitter injection filters. | Bernd Laquai, Yi Cai |
| 2001 | 99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor. | Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott |
| 2001 | The future of delta I_DDQ testing. | Bram Kruseman, Rudger van Veen, Kees van Kaam |
| 2001 | Delay testing considering crosstalk-induced effects. | Angela Krstic, Jing-Jia Liou, Yi-Min Jiang, Kwang-Ting Cheng |
| 2001 | A study of bridging defect probabilities on a Pentium (TM) 4 CPU. | Venkatram Krishnaswamy, A. B. Ma, Praveen Vishakantaiah |
| 2001 | Test vector encoding using partial LFSR reseeding. | C. V. Krishna, Abhijit Jas, Nur A. Touba |
| 2001 | A practical built-in current sensor for I_DDQ testing. | Hoki Kim, D. M. H. Walker, David Colby |
| 2001 | Test evaluation and data on defect-oriented BIST architecture for high-speed PLL. | Seongwon Kim, Mani Soma |
| 2001 | Frequency detection-based boundary-scan testing of AC coupled nets. | Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick |
| 2001 | A new multiple weight set calculation algorithm. | Hong-Sik Kim, Jin-kyue Lee, Sungho Kang |
| 2001 | DPDAT: data path direct access testing. | Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine |