| 2001 | A building block BIST methodology for SOC designs: a case study. | Patrick R. Gallagher Jr., Vivek Chickermane, Steven Gregor, Thomas S. Pierre |
| 2001 | AMLETO: a multi-language environment for functional test generation. | Alessandro Fin, Franco Fummi, Graziano Pravadelli |
| 2001 | Moving from mixed signal to RF test hardware development. | John Ferrario, Randy Wolf, Hanyi Ding |
| 2001 | Unsafe board states during PC-based boundary-scan testing. | William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo |
| 2001 | Tailoring ATPG for embedded testing. | Rainer Dorsch, Hans-Joachim Wunderlich |
| 2001 | BIST and fault insertion re-use in telecom systems. | Snezana Dikic, Lars-Johan Fritz, Dario Dell'Aquia |
| 2001 | Practical, non-invasive optical probing for flip-chip devices. | G. Dajee, Norman Goldblatt, Ted R. Lundquist, Steven Kasapi, Keneth R. Wilsher |
| 2001 | Neighbor selection for variance reduction in I_DDQ and other parametric data. | W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |
| 2001 | Scan test sequencing hardware for structural test. | Jamie Cullen |
| 2001 | AC-JTAG: empowering JTAG beyond testing DC nets. | Sung Soo Chung, Sanghyeon Baeg |
| 2001 | GRAAL: a tool for highly dependable SRAMs generation. | Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Franco Bigongiari |
| 2001 | A high-resolution jitter measurement technique using ADC sampling. | Sasikumar Cherubal, Abhijit Chatterjee |
| 2001 | Crosstalk test generation on pseudo industrial circuits: a case study. | Liang-Chi Chen, T. M. Mak, Sandeep K. Gupta, Melvin A. Breuer |
| 2001 | Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. | John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly |
| 2001 | When zero picoseconds edge placement accuracy is not enough. | John Cheng |
| 2001 | A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. | Antonio H. Chan, Gordon W. Roberts |
| 2001 | Use of BIST in Sun Fire | John Braden, Qing Lin, Brian Smith |
| 2001 | Optimal production test times through adaptive test programming. | Scott Benner, Oluseyi Boroffice |
| 2001 | Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. | Thomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski |
| 2001 | OPMISR: the foundation for compressed ATPG vectors. | Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Knemann, Andrej Ferko |
| 2001 | Estimating burn-in fall-out for redundant memory. | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
| 2001 | Towards a unified test process: from UML to end-of-line functional test. | Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei |
| 2001 | Testing interconnects for noise and skew in gigahertz SoCs. | Amir Attarha, Mehrdad Nourani |
| 2001 | A practical guide to combining ICT & boundary scan testing. | Alan Albee |
| 2001 | Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. | Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter |