| 2026 | Late Breaking Results - Test Selection for In-Field Testing Using a Two-Dimensional Aging Space. | Irith Pomeranz, Subashini Gopalsamy, Arani Sinha, Yonsang Cho |
| 2026 | Late Breaking Results - Close-to-Functional Tests for Two-Cycle Interconnect Faults. | Irith Pomeranz |
| 2026 | Late Breaking Results - Diagnostic Test Templates for Two-Cycle Gate-Exhaustive Faults. | Irith Pomeranz |
| 2026 | Exploring Agentic LLM Paradigms for Hardware Verification across Abstraction Levels. | Sudipta Paria, Swarup Bhunia |
| 2026 | Reliable Emerging Electronics in Wearable and Implantable Healthcare Applications. | Priyanjana Pal, Paula Carolina Lozano Duarte, Suhas Krishna Kashyap, Mehdi B. Tahoori, Caroline J. Smith, Yuna Jung, Daniel W. Gulick, Jennifer Blain, Sule Ozev |
| 2026 | TRACK: Telemetry-based Representation Analysis via Centered Kernel Alignment for Silicon Lifecycle Management. | Eduardo Ortega, Jonti Talukdar, Hsiao-Ping Ni, Krishnendu Chakrabarty |
| 2026 | Algorithm-Technology Co-Optimization for Reliable NVM-CAM Systems. | Ali Nezhadi, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori |
| 2026 | Machine learning calibration for radios. | Shamma Nasrin, Arindam Sanyal |
| 2026 | LLM4SecurePQC: LLM-Driven and Side-Channel Resilient Hardware Synthesis of PQC Cores. | Mohammed Nabeel, Buddhi Perera, Zeng Wang, Ozgur Sinanoglu, Johann Knechtel, Ramesh Karri |
| 2026 | Automation of Polynomial Formal Verification using Large Language Models. | Luca Mller, Khushboo Qayyum, Nele Hugo, Muhammad Hassan, Rolf Drechsler |
| 2026 | Variation-Aware Post-Manufacturing Calibration for ReRAM-based Content-Addressable Memory. | Mahta Mayahinia, Haneen G. Hezayyin, Mehdi B. Tahoori |
| 2026 | From Language to Logic: Bridging LLMs & Formal Representations for RTL Assertion Generation. | Nowfel Mashnoor, Hadi Kamali, Kimia Zamiri Azar |
| 2026 | Accelerating Analog Test through Firmware-Hardware Driven Parallelism. | Krishna Pramod Madabhushi, Ayush Jain, Logan Pukett, William Jahner, Eslam Hag |
| 2026 | Learning Quantum Algorithm Footprints to Circumvent Obfuscation: An End-to-End Approach. | Donald Lushi, Samah Mohamed Saeed |
| 2026 | Enhancing Robustness of Content-Addressable Memories for In-Memory Search. | Liu Liu, Tomas Sousa Pereira, Mohammad Mehdi Sharifi, Pengyu Ren, Bo Wen, Can Li, Kai Ni, Michael T. Niemier, X. Sharon Hu |
| 2026 | Efficient Trimming Test Approach for STT-MRAMs with Merged Reference Scheme. | Pei-Yun Lin, Jin-Fu Li |
| 2026 | An Effective Built-In Self-Test Scheme for Digital Computing-In Memories with MAC Function. | Wen-Ching Liao, Kai-Hsiang Chang, Jin-Fu Li |
| 2026 | Experimental Validation of Spatial Autocorrelation Framework for RowHammer Test Optimization. | Vineet Suresh Kumar, Mohammad Farmani |
| 2026 | IABIST: An IJTAG-Compliant Machine Learning-Based Analog BIST Framework for SoC Verification. | Jules Kouamo, Emmanuel Simeu, Michele Portolan |
| 2026 | Accelerating Recurring Failure Search With AI-Based Scandump Anomaly Pattern Detection. | Lay Wai Kong, Subhiksha Murugesan, Shino Korah |
| 2026 | A gm-C Oscillator-Based On-Chip Offset Calibration Technique for Analog Amplifiers. | Jhanavi Kodethoor, Can Etiz, Alex Currie, Tejasvi Das |
| 2026 | Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation. | Reza Khoshzaban, Gianmarco Mongelli, Dorian Ronga, Iacopo Guglielminetti, Michelangelo Grosso, Eric Faehn, Patrick Girard, Arnaud Virazel, Riccardo Cantoro |
| 2026 | A Physics-Informed Machine Learning Framework for Electromigration Time-to-Failure Prediction. | Saeid Karimpour, Emmanuel Nti Darko, Kelvin W. Tamakloe, Degang Chen |
| 2026 | WaferIntel: A Lightweight, SME-Driven Framework for Advanced Defect Pattern Analysis. | Dmitri V. Kalashnikov, Jianqiao Huang, Pan Yan |
| 2026 | Structural Reconstruction of Analog Circuits Using Graph Neural Networks and Transformers. | Dipali Jain, Guangwei Zhao, Kaveh Shamsi |