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IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Best Computer Systems Engineering conferences

Papers per year

199189 peak2026

Most published authors

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2026Late Breaking Results - Compressed Bit-Level Timing-Error Predictors via Binary Neural Networks.Georgios Chatzitsompanis, Nikolaos Kostakis, Georgios Karakonstantis
2026WALET: SHAP-Guided Classification of Wafer-Level E-Test Variability for Early Manufacturing Risk Detection.Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris
2026Innovative Practices Session: Efficient Multi-Die Test Architecture & Repair Methods.Tapan J. Chakraborty, Rajesh Pendurkar, Anshuman Chandra, Jennifer Dworak, Moiz Khan, Vinay Kumar Kotha
2026Next-Gen Scalable In-System-Test Architecture for Nvidia Automotive Platform.Sailendra Chadalavada, Milind Sonawane, Saranyan Sarangan, Alex Hsu, Pavan Javvaji, Shantanu Sarangi
2026C2C: Cell-to-Cell Controllability Evaluation for Partial Scan Selection.Hairui Cai, Zihao Wang, Liuzheng Wang, Fei Yang, Mingqi Li, Lingxiang Liao, Yu Huang, Zhouxing Su, Zhipeng Lv
2026Scan Chain Reordering for Improving Test Coverage with Compression.Hairui Cai, Zezhong Wang, Yu Huang, Naixing Wang, Zhouxing Su, Zhipeng Lv
2026MoD-CiM: A Mixture-of-Defenses Framework Against Power-Hammering Attacks in Multi-Tenant Compute-in-Memory.Ashish Reddy Bommana, Soyed Tuhin Ahmed, Farshad Firouzi, Krishnendu Chakrabarty
2026DART: Dynamic Repair for Interconnect Fault Tolerance in Hybrid Bonding.Partho Bhoumik, Zhichao Chen, Puneet Gupta, Krishnendu Chakrabarty
2026VTS2026 Contest Publication: TTTC's E.J. McCluskey Best Doctoral Thesis Award.Luca Benini, Paolo Bernardi, Alberto Bosio, Swarup Bhunia, Riccardo Cantoro, Degang Chen, Krishnendu Chakrabarty, Jayeeta Chaudhuri, Bastien Deveautour, Gabriele Filipponi, Angelo Garofalo, Salvatore Pappalardo, Sudipta Paria, Michael Rogenmoser, Philippe Sauter, Michael Sekyere, Chen Wu
2026Enhancing Testability & Security of Near-Memory Computing Architectures.Hichem Benamara, Sabrina Ait Belkacem, Maria Ramirez-Corrales, Lorenzo Ciampolini, Jean-Philippe Noel, Maha Kooli, Lila Ammoura, Ian O'Connor, Patrick Girard, Arnaud Virazel
2026VTS2026 Student Forum.Davide Baroffio, Federico Reghenzani, William Fornaciari, Dipal Halder, Sandip Ray
2026Analysis and Mitigation of Cells Programming Misalignments in PCM-based AiMC Cores.Alessio Antolini, Lorenzo Greco, Andrea Lico, Francesco Zavalloni, Riccardo Zurla, Emanuela Calvetti, Marco Pasotti, Alessandro Cabrini, Eleonora Franchi Scarselli
2026Towards LLM-Based Reasoning for Gate-Level Netlist Tasks.Mueen Almasre, Lilas Alrahis
2026The Fracture Bits in Large Language Models.Soyed Tuhin Ahmed, Farshad Firouzi, Krishnendu Chakrabarty
2025Periodic Non-Destructive Memory BIST for Automotive Applications.Wei Zou, Artur Pogiel, Albert Au, Martin Keim
2025Reliable Board-Level Degradation Prediction with Monotonic Segmented Regression under Noisy Measurement.Yuxuan Yin, Rebecca Chen, Varun Thukral, Chen He, Peng Li
2025Data-Efficient Prediction of Minimum Operating Voltage via Inter- and Intra-Wafer Variation Alignment.Yuxuan Yin, Rebecca Chen, Chen He, Peng Li
2025From Design to Inspection: Can Inspection-aware Design Enhance Reliability in Advanced Packaging?Katayoon Yahyaei, M. Shafkat M. Khan, Navid Asadizanjani
2025Designing Radiation-Hardened D Flip-Flop with Reduced Latency and Area Using Filtering Buffer.Nelson M.-C. Wu, Lowry P.-T. Wang, Chia-Wei Liang, Charles H.-P. Wen, Herming Chiueh
2025Timing-Verification Test Generation Targeting Small Delay Defects.Jiezhong Wu, Nilanjan Mukherjee, Irith Pomeranz, Kun-Han Tsai, Janusz Rajski
2025Challenge Selection for Salvaging Faulty APUFs.Yeqi Wei, Wenjing Rao, Natasha Devroye
2025Test Methodology for Detecting Defect-Based Hold-Time Faults.Cheng-Hsiang Tsai, Yu-Teng Nien, Guan-You Chen, Mango Chia-Tso Chao
2025MOSAIC: Collaborative Compute-in-Memory Arrays for Flexible and Scalable Deep Learning.Amit Ranjan Trivedi, Shamma Nasrin, Priyesh Shukla, Nastaran Darabi, Divake Kumar, Dinithi Jayasuriya, Nethmi Jayasinghe
2025BugWhisperer: Fine-Tuning LLMs for SoC Hardware Vulnerability Detection.Shams Tarek, Dipayan Saha, Sujan Kumar Saha, Farimah Farahmandi
2025Innovation Practices Track: Industry RAS/SDC Innovative Practices - from Silicon to Mega Fleets.Fei Su, Yogesh Varma, John Holm, Drew Walton
76–100 of 2,208← PreviousNext →

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