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IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Papers per year

199189 peak2026

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2025SPRING: Systematic Profiling of Randomly Interconnected Neural Networks Generated by HLS.Rui Shi, Seda Ogrenci
2025Artificial Bee Colony Optimization to Accelerate High-Speed Serial I/O Tx Equalization.Cesar A. Snchez-Martnez, Paulo Lopez-Meyer, Andres Viveros-Wacher
2025Special Session: ThreatLens: LLM-guided Threat Modeling and Test Plan Generation for Hardware Security Verification.Dipayan Saha, Hasan Al Shaikh, Shams Tarek, Farimah Farahmandi
2025GLLaMoR: Graph-based Logic Locking by Large Language Models for Enhanced Robustness.Akashdeep Saha, Prithwish Basu Roy, Johann Knechtel, Ramesh Karri, Ozgur Sinanoglu, Lilas Alrahis
2025Special Session: Bringing Symbolic Execution to the Security Verification of Hardware Designs.Kaki Ryan, Cynthia Sturton
2025CED-HDC: Lightweight Concurrent Error Detection for Reliable Hyperdimensional Computing.Mahboobe Sadeghipour Roodsari, Vincent Meyers, Mehdi B. Tahoori
2025Gate Leakage Current Integration-Based Dielectric Breakdown Monitor in a 12nm FinFET Process.Mateo Rendn, Ian Hill, Andr Ivanov
2025Opportunities for Built-In Self-Test Within Emerging mm-Wave Phased-Array and MIMO Architectures.Negar Reiskarimian
2025CBM-TI: Code-Based Masking against Glitches by Hybridization with Threshold Implementation.Hasin Ishraq Reefat, Hossein Pourmehrani, Wei Cheng, Claude Carlet, Abderrahman Daif, Cdric Tavernier, Sylvain Guilley, Naghmeh Karimi
2025A Multi-Step Algorithm to Increase Measurement Accuracy of mm-Wave BIST Using Periodic Structures.Noah Rajbharti, Esteban Chacon, Muslum Emir Avci, Jennifer Kitchen, Sule Ozev
2025CHEF: CHaracterizing Elusive Logic Circuit Failures.Ruben Purdy, Chris Nigh, Wei Li, R. D. Shawn Blanton
2025Low-Power Voltage Reference: Review & Progress.Abhishek Pullela, Ashfakh Huluvallay, Arpan Jain, Zia Abbas, Inhee Lee
2025Fine-Grained Steepening of the Fault Coverage Curve of a Pool of Functional Test Sequences.Irith Pomeranz
2025Chip Aging and Double Transition Faults.Irith Pomeranz
2025Machine Learning Based Calibration Techniques for ADCs: An Overview.Tuan Quang Pham, Sai Sanjeet, Bibhu Datta Sahoo
2025Towards Automated Verification of IP and COTS: Leveraging LLMs in Pre- and Post-Silicon Stages.Sudipta Paria, Aritra Dasgupta, Swarup Bhunia
2025Defect Severity Analysis for Analog Circuits Using Zoom Search and Hierarchical Fault Simulation.Mehmet Onder, Lakshmanan Balasubramanian, Rubin A. Parekhji, Suriyaprakash Natarajan, Sule Ozev
2025Innovation Practices Track: Frontiers in Diagnosis and Debug.Suriyaprakash Natarajan, Saghir A. Shaikh, Wu-Tung Cheng, Sankaran Menon
2025From Signals to Features to Insights: Multi-Level Novelty Detection for Fast Scientific Discovery.Devashri Naik, Nastaran Darabi, Sina Tayebati, Dinithi Jayasuriya, Shamma Nasrin, Danush Shekar, Corrinne Mills, Benjamin Parpillon, Farah Fahim, Mark S. Neubauer, Amit Ranjan Trivedi
2025Gradient Attention Map Based Verification of Deep Convolutional Neural Networks with Application to X-ray Image Datasets.Omid Halimi Milani, Amanda Nikho, Lauren Mills, Marouane Tliba, Ahmet Enis etin, Mohammed H. Elnagar
2025OpenAssert: Towards Secure Assertion Generation using Large Language Models.Anand Menon, Samit Shahnawaz Miftah, Amisha Srivastava, Shamik Kundu, Shovik Kundu, Arnab Raha, Suvadeep Banerjee, Deepak Mathaikutty, Kanad Basu
2025MicroFI: TensorFlow Lite based Fault Injection Framework for Microcontrollers.Leonardo Alexandrino De Melo, Rodrigo Possamai Bastos, Alberto Bosio
2025SCAPEgoat: Side-channel Analysis Library.Dev Mehta, Trey Marcantino, Mohammad Hashemi, Sam Karkache, Dillibabu Shanmugam, Patrick Schaumont, Fatemeh Ganji
2025Electromigration Reliability Analysis of SRAM-based Register Files in GPUs and AI Accelerators.Mahta Mayahinia, Mehdi Baradaran Tahoori
2025LLM-IFT: LLM-Powered Information Flow Tracking for Secure Hardware.Nowfel Mashnoor, Mohammad Akyash, Hadi Kamali, Kimia Zamiri Azar
101125 of 2,208← PreviousNext →

Comparable venues

Other A*/A conferences filed under the same field of research.