| 2025 | SALTY: Explainable Artificial Intelligence Guided Structural Analysis for Hardware Trojan Detection. | Tanzim Mahfuz, Pravin Gaikwad, Tasneem Suha, Swarup Bhunia, Prabuddha Chakraborty |
| 2025 | Revisiting DRAM Read Disturbance: Identifying Inconsistencies Between Experimental Characterization and Device-Level Studies. | Haocong Luo, Ismail Emir Yksel, Ataberk Olgun, A. Giray Yagliki, Onur Mutlu |
| 2025 | ML-based Adaptive Wafer Sort to Preserve Diagnostic Information. | Yun-Sheng Liu, Min-Hsin Liu, James Chien-Mo Li |
| 2025 | Characterization and All-Region Virtual-Source Modeling of 40 nm GaN HEMT Technology for High Frequency IC Design. | Kexin Li, Armagan Dascurcu, Hari Vemuri, Harish Krishnaswamy |
| 2025 | Multi-core Vmin and Worst-core Vmin Prediction using SOMAC. | Jeng-Yu Liao, Li-Yang Wang, James Chien-Mo Li, Harry H. Chen |
| 2025 | Special Session: Security Verification of Microelectronic Systems with Integrated AI Accelerators: Scope, Practice, and Challenges. | Kazi Mejbaul Islam, Tambiara Tabassum, Dipal Halder, Sandip Ray |
| 2025 | Fault Modeling and Testing of ReRAM-based CAM Array. | Haneen G. Hezayyin, Mahta Mayahinia, Mehdi Baradaran Tahoori |
| 2025 | Garblet: Multi-party Computation for Protecting Chiplet-based Systems. | Mohammad Hashemi, Shahin Tajik, Fatemeh Ganji |
| 2025 | ChipMnd: LLMs for Agile Chip Design. | Farshad Firouzi, David Z. Pan, Jiaqi Gu, Bahar J. Farahani, Jayeeta Chaudhuri, Ziang Yin, Pingchuan Ma, Peter Domanski, Krishnendu Chakrabarty |
| 2025 | Silent Data Corruption: Advancing Detection, Diagnosis, and Mitigation Strategies. | Peter Domanski, Mukarram Ali Faridi, Gabriel Kaunang, Wilson Pradeep, Adit D. Singh, Muhammad Alfian Amrizal, Yanjing Li, Farshad Firouzi, Krishnendu Chakrabarty |
| 2025 | High-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters. | Emmanuel Nti Darko, Saeid Karimpour, Degang Chen |
| 2025 | APT: Optimal Tree for Diagnosis Simulation. | Wu-Tung Cheng |
| 2025 | Revisiting Microelectronics Resilience and Reliability in the Era of AI. | Arjun Chaudhuri, Bonita Bhaskaran |
| 2025 | AI for Test : (Innovation Practices Track). | Arjun Chaudhuri, Soyed Tuhin Ahmed |
| 2025 | Hardware Security and Test for AMS Circuits. | Arjun Chaudhuri |
| 2025 | HighTPI: A Hierarchical Graph Based Intelligent Method for Test Point Insertion. | Zhiteng Chao, Bin Sun, Hongqin Lyu, Ge Yu, Minjun Wang, Wenxing Li, Zizhen Liu, Jianan Mu, Shengwen Liang, Jing Ye, Xiaowei Li, Huawei Li |
| 2025 | Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration. | Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2025 | Test, Debug, and Repair for Chiplet-Based Designs. | Anshuman Chandra, Esteban Garita-Rodrguez, Pradipta Ghosh |
| 2025 | Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging | Partho Bhoumik, Christopher Bailey, Krishnendu Chakrabarty |
| 2025 | Machine-learning based Blind Digital Calibration of Time-Interleaved ADC. | Sumukh Prashant Bhanushali, Shamma Nasrin, Debnath Maiti, Arindam Sanyal |
| 2025 | DC Stimulus Electrical Calibration of MEMS Accelerometers. | Ishaan Bassi, Sule Ozev |
| 2025 | Reliability Challenges for Advanced Packaging. | Christopher Bailey |
| 2025 | Test Complexity in the Semiconductor Landscape. | Suma Ayyagari |
| 2025 | CLIP: A Structural Approach to Cut Points Matching for Logic Equivalence Checking. | Dinesh Reddy Ankireddy, Sudipta Paria, Aritra Dasgupta, Sandip Ray, Swarup Bhunia |
| 2025 | Special Session: Trustworthy Hardware-AI at the Cloud. | Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Snchez, Arani Sinha, Vittorio Turco |