| 2025 | Security Verification and Secure Testing Solutions. | Sohrab Aftabjahani, Wilson Pradeep |
| 2024 | Static Gate-Level Information Flow for Hardware Information Security with Bounded Model Checking. | Yiqiang Zhao, Gonsen Qu, Qizhi Zhang, Yao Li, Zhengyang Li, Jiaji He |
| 2024 | Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. | Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2024 | Millimeter-wave and THz Measurement Practices. | Saeed Zeinolabedinzadeh |
| 2024 | Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics. | Ralf E.-H. Yee, Nicholas Y.-J. Su, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh |
| 2024 | Drop-Connect as a Fault-Tolerance Approach for RRAM-based Deep Neural Network Accelerators. | Mingyuan Xiang, Xuhan Xie, Pedro Savarese, Xin Yuan, Michael Maire, Yanjing Li |
| 2024 | A Discovery Platform to Characterize Emerging Nonvolatile Memories for Computing. | D. Wilson, Nad E. Gilbert, Matt Spear, J. Short, Christopher H. Bennett, William Wahby, Joshua E. Kim, Robin Jacobs-Gedrim, Tianyao Patrick Xiao, Sapan Agarwal, Matthew J. Marinella |
| 2024 | High Precision Adaptive Calibration Feedback in RF Front-end for Digital Pre-distortion Application. | Emre Ulusoy, Bahadir Ozkan, Furkan Barin, Fatih Maden, Ercem Yesil, Dursun Baran, Adem Eren, Tufan Coskun Karalar, Ahmet Tekin, Ertan Zencir |
| 2024 | Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects. | Stephen Traynor, Saidapet Ramesh, Maryfe Hernandez, Lawrence Herr, Scott Chen |
| 2024 | A Method for Simulating Mixed-Signal ATE Tests. | Stephen Sunter, Vladimir Zivkovic, Bartlomiej Praselski |
| 2024 | Silicon Photonic 2.5D Interposer Networks for Overcoming Communication Bottlenecks in Scale-out Machine Learning Hardware Accelerators. | Febin Sunny, Ebadollah Taheri, Mahdi Nikdast, Sudeep Pasricha |
| 2024 | Fuzz Wars: The Voltage Awakens - Voltage-Guided Blackbox Fuzzing on FPGAs. | Kai Su, Mark Giraud, Anne Borcherding, Jonas Krautter, Philipp Nenninger, Mehdi Baradaran Tahoori |
| 2024 | Innovation Practices Track: Advances on Silicon Lifecycle Reliability, Safety and Security. | Fei Su, Jyotika Athavale, Zohaib Khan, Marc Witteman |
| 2024 | Innovative Practices Track: Session 2 Silent Data Corruption. | Arani Sinha, Adit D. Singh |
| 2024 | Innovative Practices Track: Session 4 AI Applications in Test. | Arani Sinha, Stefano Di Carlo |
| 2024 | Innovative Practices Track: Session 3 Test and Functional Safety Standards. | Arani Sinha |
| 2024 | Unified Functional Safety Framework for advance multi-domain SoCs combining ISO 26262 & IEC61508. | Gulroz Singh, Ankit Hegde, Vaibhav Kumar |
| 2024 | Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations. | Robert Limas Sierra, Juan-David Guerrero-Balaguera, Francesco Pessia, Josie E. Rodriguez Condia, Matteo Sonza Reorda |
| 2024 | Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using Dense Addressable Arrays. | Raphael Robertazzi, David J. Frank, Kevin Tien, John Timmerwilke, Peilin Song, Daniel J. Friedman |
| 2024 | Power-up Self Auto Calibration of High Speed SAR Converter in a 22nm FD-SOI CMOS Process. | Vahid Rezazadehshabilouyoliya, Muhammed Mustafa Kizmaz, Ahmet Tekin |
| 2024 | Test Methods for TID Effects on Capacitors. | Chandarasekaran Ramamurthy, Harrish Anbazhagan, B. Rajeswara |
| 2024 | Test Compaction Using (k, 1)-Cycle Tests. | Irith Pomeranz |
| 2024 | Thermal Modeling and Management Challenges in Heterogenous Integration: 2.5D Chiplet Platforms and Beyond. | Jaehyun Park, Alish Kanani, Lukas Pfromm, Harsh Sharma, Parth Solanki, Eric Tervo, Janardhan Rao Doppa, Partha Pratim Pande, mit Y. Ogras |
| 2024 | A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs. | Gaines Odom, Zakia Tamanna Tisha, Ujjwal Guin |
| 2024 | Logic-AAA: Debug of Logic Failures with an on-ATE Expert System. | Chris Nigh, Ronald D. Blanton |