IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Papers per year

199189 peak2026

Most published authors

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
1991	Distributed self-diagnosis of VLSI mesh array processors.	Michal Cutler, Stephen Y. H. Su, Mingshien Wang
1991	Issues of integrating the IEEE Std 1149.1 into a gate array.	Robert Cortez, R. Dandapani, Mike Yeager
1991	Modeling the effects of imperfect production testing on reconfigurable VLSI chips.	Bruno Ciciani
1991	Aspects on integration of high-speed multiplexers and demultiplexers in VLSI test systems.	Michael Chowanetz, Claus Kuntzsch, Werner Wolz
1991	A statistical model for fault coverage analysis.	Chung Ho Chen, N. L. Soong
1991	Use of CrossCheck test technology in practical applications.	Susheel J. Chandra, Tushar Gheewala, Hector R. Sucar, George Swan
1991	Specifications for the development of an expert tool for the automatic optical understanding of electronic circuits: VLSI reverse engineering.	Nikolaos G. Bourbakis, Chittoor V. Ramamoorthy
1991	A multilayered ceramic (MLC) interface design for 125+MHz performance wafer probing [of SRAMs].	George M. Belansek, Peter Loomis, Fred J. Towler, Charles Warner, Donald Wheeler

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