| 2017 | Soft error analysis of MTJ-based logic-in-memory full adder: Threats and solution. | Javad Talafy, Hamid R. Zarandi |
| 2017 | PUFMon: Security monitoring of FPGAs using physically unclonable functions. | Shahin Tajik, Julian Fietkau, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit |
| 2017 | NBTI/PBTI tolerant arbiter PUF circuits. | Koyo Suzuki, Katsuyoshi Miura, Koji Nakamae |
| 2017 | Analysis of radiation-induced cross domain errors in TMR architectures on SRAM-based FPGAs. | Luca Sterpone, Luca Boragno |
| 2017 | A generic embedded sequence generator for constrained-random validation with weighted distributions. | Xiaobing Shi, Nicola Nicolici |
| 2017 | Test pattern generation to detect multiple faults in ROBDD based combinational circuits. | Toral Shah, Anzhela Yu. Matrosova, Virendra Singh |
| 2017 | Advanced ECC solution for automotive SoCs. | Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian |
| 2017 | Variation tolerant BTI monitoring in SRAM cells. | Yiorgos Sfikas, Yiorgos Tsiatouhas |
| 2017 | Energy-efficient and error-resilient iterative solvers for approximate computing. | Alexander Schll, Claus Braun, Hans-Joachim Wunderlich |
| 2017 | Temporal redundancy latch-based architecture for soft error mitigation. | Robert Schmidt, Alberto Garca Ortiz, Grschwin Fey |
| 2017 | Fast power overhead prediction for hardware redundancy-based fault tolerance. | Stefan Scharoba, Heinrich Theodor Vierhaus |
| 2017 | Reliability issues in RRAM ternary memories affected by variability and aging mechanisms. | Antonio Rubio, Manuel Escudero, Peyman Pouyan |
| 2017 | Minimal exercise vector generation for reliability improvement. | P. Madhukar Reddy, Stavros Hadjitheophanous, Vassos Soteriou, Paul V. Gratz, Maria K. Michael |
| 2017 | On comparison of robust configurable FPGA encoders for dependable industrial communication systems. | Petr Pfeifer, Farnoosh Hosseinzadeh, Heinrich Theodor Vierhaus |
| 2017 | Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications. | Harsh N. Patel, Benton H. Calhoun, Randy W. Mann |
| 2017 | Voltage margins identification on commercial x86-64 multicore microprocessors. | George Papadimitriou, Manolis Kaliorakis, Athanasios Chatzidimitriou, Charalampos Magdalinos, Dimitris Gizopoulos |
| 2017 | In-situ Fmax/Vmin tracking for energy efficiency and reliability optimization. | Ivan Miro Panades, Edith Beign, Olivier Billoint, Yvain Thonnart |
| 2017 | Hardware Trojan detection and classification based on steady state learning. | Masaru Oya, Masao Yanagisawa, Nozomu Togawa |
| 2017 | BPPT - Bulk potential protection technique for hardened sequentials. | Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong |
| 2017 | Reliability of computing systems: From flip flops to variables. | Giorgio Di Natale, Maha Kooli, Alberto Bosio, Michele Portolan, Rgis Leveugle |
| 2017 | Handling of permanent faults in dynamically scheduled processors. | Felix Mhlbauer, Lukas Schrder, Mario Schlzel |
| 2017 | Probabilistic error detection and correction in switched capacitor circuits using checksum codes. | Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | Simulation-based analysis of FF behavior in presence of power supply noise. | Yukiya Miura, Takuya Yamamoto |
| 2017 | On-line testing of sensor networks: A case study. | Jos Angel Miranda, Anna Vaskova, Marta Portela-Garca, Mario Garca-Valderas, Celia Lpez-Ongil |
| 2017 | Dynamic aging compensation and Safety measures in Automotive environment. | Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix |