| 2017 | Trojan circuits preventing and masking in sequential circuits. | Anjela Yu. Matrosova, Eugeniy Mitrofanov, Sergei Ostanin, Irina Kirienko |
| 2017 | Automating wafer-level test of uncooled infrared detectors using wafer-prober. | Mohamed Makhlouf, Diana Goller, Lutz Gendrisch, Stephan Kolnsberg, Franz Vogt, Alexander Utz, Dirk Weiler, Holger Vogt |
| 2017 | Thermal laser attack and high temperature heating on HfO2-based OxRAM cells. | Alexis Krakovinsky, Marc Bocquet, Romain Wacquez, Jean Coignus, Jean-Michel Portal |
| 2017 | SICTA: A superimposed in-circuit fault tolerant architecture for SRAM-based FPGAs. | Alexandra Kourfali, Amit Kulkarni, Dirk Stroobandt |
| 2017 | A new 3-bit burst-error correcting code. | Alexander Klockmann, Georg Georgakos, Michael Gssel |
| 2017 | On-line monitoring of system health using on-chip SRAMs as a wearout sensor. | Woongrae Kim, Taizhi Liu, Linda Milor |
| 2017 | Jamming resistant encoding for non-uniformly distributed information. | Batya Karp, Yerucham Berkowitz, Osnat Keren |
| 2017 | Weighted logic locking: A new approach for IC piracy protection. | Nikolaos Karousos, Konstantinos Pexaras, Irene G. Karybali, Emmanouil Kalligeros |
| 2017 | A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. | Ahmed Ibrahim, Hans G. Kerkhoff |
| 2017 | Controller augmentation and test point insertion at RTL for concurrent operational unit testing. | Toshinori Hosokawa, Shun Takeda, Hiroshi Yamazaki, Masayoshi Yoshimura |
| 2017 | Hardware Trojans classification for gate-level netlists using multi-layer neural networks. | Kento Hasegawa, Masao Yanagisawa, Nozomu Togawa |
| 2017 | Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT. | Ghaith Bany Hamad, Ghaith Kazma, Otmane At Mohamed, Yvon Savaria |
| 2017 | Instruction-based self-test for delay faults maximizing operating temperature. | Nihar Hage, Rohini Gulve, Masahiro Fujita, Virendra Singh |
| 2017 | Design flows for resilient energy-efficient systems. | Mohammad Saber Golanbari, Mehdi Baradaran Tahoori |
| 2017 | An effective functional safety infrastructure for system-on-chips. | Christophe Eychenne, Yervant Zorian |
| 2017 | Deterministic network on chip for deploying real time applications on many-core processors. | Stefano Esposito, Massimo Violante |
| 2017 | An on-line test strategy and analysis for a 1T1R crossbar memory. | Manuel Escudero-Lopez, Francesc Moll, Antonio Rubio, Ioannis Vourkas |
| 2017 | Cache timing attacks countermeasures and error detection in Euclidean addition chains based scalar multiplication algorithm for elliptic curves. | Fangan-Yssouf Dosso, Pascal Vron |
| 2017 | Field profiling & monitoring of payload transistors in FPGAs. | Da Cheng, Amitava Majumdar, Xiaobao Wang, Nui Chong |
| 2017 | Investigation of critical path selection for in-situ monitors insertion. | Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel |
| 2017 | On the in-field test of embedded memories. | Paolo Bernardi, Marco Restifo, Ernesto Snchez, Matteo Sonza Reorda |
| 2017 | Robustness in automotive electronics: An industrial overview of major concerns. | Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Snchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner |
| 2017 | Assessment of the amplitude-duration criterion for SET/SEU robustness evaluation. | Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer |
| 2017 | 6T CMOS SRAMs reliability monitoring through stability measurements. | Bartomeu Alorda, Gabriel Torrens, Sebasti A. Bota |
| 2017 | EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety. | Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal |