| 2009 | Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. | Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2009 | Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs. | Niccol Battezzati, Filomena Decuzzi, Massimo Violante, Michel Briet |
| 2009 | Comparing transient-fault effects on synchronous and on asynchronous circuits. | Rodrigo Possamai Bastos, Yannick Monnet, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis |
| 2009 | Designing fault tolerant FSM by nano-PLA. | Samary Baranov, Ilya Levin, Osnat Keren, Mark G. Karpovsky |
| 2009 | Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs. | Jos Rodrigo Azambuja, Fernando Sousa, Lucas Rosa, Fernanda Lima Kastensmidt |
| 2009 | A fast error correction technique for matrix multiplication algorithms. | Costas Argyrides, Carlos Arthur Lang Lisba, Dhiraj K. Pradhan, Luigi Carro |
| 2009 | Highs and lows of radiation testing. | Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schfer, Cyrille Beltrando |
| 2008 | On-Line Testing of Lab-on-Chip Using Digital Microfluidic Compactors. | Yang Zhao, Krishnendu Chakrabarty |
| 2008 | Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips. | Piotr Zajac, Jacques Henri Collet, Andrzej Napieralski |
| 2008 | An Enhanced Logic BIST Architecture for Online Testing. | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2008 | A Systematical Method of Quantifying SEU FIT. | Shi-Jie Wen, Dan Alexandrescu, Renaud Perez |
| 2008 | Yield Improvement, Fault-Tolerance to the Rescue?. | Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2008 | Budget-Dependent Control-Flow Error Detection. | Ramtilak Vemu, Jacob A. Abraham |
| 2008 | Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. | Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh |
| 2008 | Deterministic Built-in TPG with Segmented FSMs. | Samara Sudireddy, Jayawant Kakade, Dimitri Kagaris |
| 2008 | SRAM Cell Design Protected from SEU Upsets. | Yuriy Shiyanovskii, Francis G. Wolff, Christos A. Papachristou |
| 2008 | SystemC-Based Minimum Intrusive Fault Injection Technique with Improved Fault Representation. | Rishad A. Shafik, Paul M. Rosinger, Bashir M. Al-Hashimi |
| 2008 | Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. | Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2008 | Soft Error Rates of Hardened Sequentials utilizing Local Redundancy. | Norbert Seifert |
| 2008 | Special Session 1: Radiation Hardening Techniques. | Norbert Seifert |
| 2008 | A Built-In Self-Test Scheme for Soft Error Rate Characterization. | Alodeep Sanyal, Syed M. Alam, Sandip Kundu |
| 2008 | Physical Demonstration of Polymorphic Self-Checking Circuits. | Richard Ruzicka, Luks Sekanina, Roman Prokop |
| 2008 | Communication Aware Recovery Configurations for Networks-on-Chip. | Claudia Rusu, Cristian Grecu, Lorena Anghel |
| 2008 | Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS. | Philippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche |
| 2008 | New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. | Michael Richter, Klaus Oberlnder, Michael Gssel |