| 2008 | Reliability in Application Specific Mesh-Based NoC Architectures. | Fatemeh Refan, Homa Alemzadeh, Saeed Safari, Paolo Prinetto, Zainalabedin Navabi |
| 2008 | False Error Study of On-line Soft Error Detection Mechanisms. | M. Kiran Kumar Reddy, Bharadwaj S. Amrutur, Rubin A. Parekhji |
| 2008 | Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. | Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco |
| 2008 | Totally Fault Tolerant RNS Based FIR Filters. | Salvatore Pontarelli, Gian Carlo Cardarilli, Marco Re, Adelio Salsano |
| 2008 | Development of a Testbench for Validation of DMT and DT2 Fault-Tolerant Architectures on SOI PowerPC7448. | Michel Pignol, Thierry Parrain, Vincent Claverie, Christian Bolat, Guy Estaves |
| 2008 | A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs. | Wilson J. Prez H., Jaime Velasco-Medina, Danilo Ravotto, Edgar E. Snchez, Matteo Sonza Reorda |
| 2008 | A BISR Architecture for Embedded Memories. | Kiamal Z. Pekmestzi, Nicholas Axelos, Isidoros Sideris, Nikos K. Moshopoulos |
| 2008 | A Modular Memory BIST for Optimized Memory Repair. | Philipp hler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand |
| 2008 | Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters. | Muhammad Mudassar Nisar, Abhijit Chatterjee |
| 2008 | Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? | Michael Nicolaidis |
| 2008 | Soft Error Protection Techniques. | Subhasish Mitra |
| 2008 | Directed Random SBST Generation for On-Line Testing of Pipelined Processors. | Andreas Merentitis, George Theodorou, Mihalis Giorgaras, Nektarios Kranitis |
| 2008 | Fault Tolerant Reversible Finite Field Arithmetic Circuits. | Jimson Mathew, Jawar Singh, Anas Abu Taleb, Dhiraj K. Pradhan |
| 2008 | Design Techniques for Bit-Parallel Galois Field Multipliers with On-Line Single Error Correction and Double Error Detection. | Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan |
| 2008 | Software Self-Testing of a Symmetric Cipher with Error Detection Capability. | Paolo Maistri, Cyril Excoffon, Rgis Leveugle |
| 2008 | A Low-Cost Accumulator-Based Test Pattern Generation Architecture. | Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick |
| 2008 | Smart Hardening for Round-based Encryption Algorithms: Application to Advanced Encryption Standard. | Celia Lpez-Ongil, Alejandro Jimnez-Horas, Marta Portela-Garca, Mario Garca-Valderas, Enrique San Milln, Luis Entrena |
| 2008 | Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. | Damien Leroy, Rmi Gaillard, Erwin Schfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong |
| 2008 | Basic Architecture for Logic Self Repair. | Tobias Koal, Heinrich Theodor Vierhaus |
| 2008 | A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. | Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi |
| 2008 | Modeling and Simulation of Circuit Aging in Scaled CMOS Design. | Yu (Kevin) Kao |
| 2008 | Integrating Scan Design and Soft Error Correction in Low-Power Applications. | Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin |
| 2008 | Verification and Analysis of Self-Checking Properties through ATPG. | Marc Hunger, Sybille Hellebrand |
| 2008 | A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. | Zhengfeng Huang, Huaguo Liang |
| 2008 | Soft-Error Vulnerability of Sub-100-nm Flip-Flops. | Tino Heijmen |