| 2002 | Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register. | Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis |
| 2002 | Adaptive IDDQ: How to Set an IDDQ Limit for any Device Under Test. | Carlo Dallavalle |
| 2002 | High Speed 15 ns 4 Mbits SRAM for Space Application. | Bernard Coloma, Patrick Delaunay, Olivier Husson |
| 2002 | Automated Synthesis of SEU Tolerant Architectures from OO Descriptions. | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto |
| 2002 | Bit Flip Injection in Processor-Based Architectures: A Case Study. | Gian Carlo Cardarilli, F. Kaddour, A. Leandri, Marco Ottavi, Salvatore Pontarelli, Raoul Velazco |
| 2002 | A System Level Approach in Designing Dual-Duplex Fault Tolerant Embedded Systems. | Cristiana Bolchini, Luigi Pomante, Fabio Salice, Donatella Sciuto |
| 2002 | The YATE Fail-Safe Interface: The User's Point of View. | Dominique Bied-Charreton, D. Guillon, B. Jacques |
| 2002 | Analysis of the Equivalences and Dominances of Transient Faults at the RT Level. | Luis Berrojo, Isabel Gonzlez, Luis Entrena, Celia Lpez, Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero |
| 2002 | A Low Power Pseudo-Random BIST Technique. | Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz |
| 2002 | Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing. | N. Axelos, J. Watson, D. Taylor, A. Platts |
| 2002 | A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. | Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2002 | An Off-Chip Sensor Circuit for On-Line Transient Current Testing. | Bartomeu Alorda, Andr Ivanov, Jaume Segura |
| 2002 | On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. | Chouki Aktouf, Benot Pannetier, Pierre Lematre-Auger, Smail Tedjini |
| 2002 | Fault Tolerance Evaluation Using Two Software Based Fault Injection Methods. | Astrit Ademaj, Petr Grillinger, Pavel Herout, Jan Hlavicka |
| 2002 | BIST-Based Delay-Fault Testing in FPGAs. | Miron Abramovici, Charles E. Stroud |
| 2001 | Power Constrained Test Scheduling with Low Power Weighted Random Testing. | Xiaodong Zhang, Kaushik Roy |
| 2001 | An On-Line Testing Approach Using Code-Perturbation. | Zan Yang, Gwan Choi |
| 2001 | A New Approach to Design Reliable Real-Time Speech Recognition Systems. | Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr. |
| 2001 | Concurrent Detection of Soft Errors Based on Current Monitoring. | Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos, Costas Efstathiou |
| 2001 | CMOS Differential and Absolute Thermal Sensors. | Ashish Syal, Victor Lee, Andr Ivanov, Josep Altet |
| 2001 | A Robust Fault Detection Scheme for Concurrent Testing of Linear Digital Systems. | Emmanuel Simeu, Ahmad Abdelhay |
| 2001 | TRACS-TRansient Activity Checking with Scan Cells. | Jose Miguel Vieira dos Santos |
| 2001 | Logic Insertion to Speed-Up Logic Verification: A Recent Development. | Dhiraj K. Pradhan |
| 2001 | On the Design of Self-Testing Checkers for Modified Berger Codes. | Stanislaw J. Piestrak, Dimitris Bakalis, Xrysovalantis Kavousianos |
| 2001 | On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity. | Matthias Pflanz, Karsten Walther, Heinrich Theodor Vierhaus |