| 2001 | Exploiting FPGA for Accelerating Fault Injection Experiments. | Pierluigi Civera, Luca Macchiarulo, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante |
| 2001 | Automatic Bias Generation Using Pipeline Instruction State Coverage for Biased Random Instruction Generation. | Mrinal Bose, Elizabeth M. Rudnick, Magdy S. Abadir |
| 2001 | A Gated Clock Scheme for Low Power Scan-Based BIST. | Yannick Bonhomme, Patrick Girard, Los Guiller, Christian Landrault, Serge Pravossoudovitch |
| 2001 | Designing Reliable Embedded Systems Based on 32 Bit Microprocessors. | Cristiana Bolchini, Fabio Salice, Donatella Sciuto |
| 2001 | Reliability Properties Assessment at System Level: A Co-design Framework. | Cristiana Bolchini, Luigi Pomante, Fabio Salice, Donatella Sciuto |
| 2001 | Self-Stabilization Testing of LUT-Based FPGA Designs by Fault Injection. | Michael Bhnel, Reinhold Weiss |
| 2001 | Validation of a Software Dependability Tool via Fault Injection Experiments. | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto |
| 2001 | Fault Diagnosis for Linear Analog Circuits with Symbolic Analysis and Reduced Observable Point Set. | Marcello Artioli, Fiorenzo Filippetti |
| 2001 | Novel Fault-Tolerant Adder Design for FPGA-Based Systems. | Monica Alderighi, Sergio D'Angelo, Giacomo R. Sechi, Cecilia Metra |
| 2001 | On-Line Testing in Continuous Operation of Embedded Systems: Modeling and Performance Evaluation. | Chouki Aktouf |
| 2001 | Path-Based Error Coverage Prediction. | Joakim Aidemark, Peter Folkesson, Johan Karlsson |
| 2001 | On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. | Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John Marty Emmert |
| 2000 | Power Reduction in Test-Per-Scan BIST. | Xiaodong Zhang, Kaushik Roy |
| 2000 | Micro-Checkpointing: Checkpointing for Multithreaded Applications. | Keith Whisnant, Zbigniew Kalbarczyk, Ravishankar K. Iyer |
| 2000 | Transient Bitflip Injection in Microprocessor Embedded Applications. | Raoul Velazco, Sana Rezgui |
| 2000 | Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL. | Fabian Vargas, Alexandre M. Amory, Raoul Velazco |
| 2000 | A Stamping Technique to Increase the Error Correction Capacity of the (127, k, d) RS Code. | T. Vallino, Abbas Dandache, Jean-Paul Delahaye, Fabrice Monteiro, Bernard Lepley |
| 2000 | A Compact Built-In Current Sensor for IDDQ Testing. | Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos |
| 2000 | Improving Fault Coverage in System Tests. | Janusz Sosnowski |
| 2000 | Relation between Fault Tolerance and Reconfiguration in Cellular Systems. | Luks Sekanina, Vladimr Drbek |
| 2000 | Concurrent Scan Monitoring and Multi-Pattern Search. | Jose Miguel Vieira dos Santos |
| 2000 | A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits. | Jos Antonio Sainz, R. Muoz, J. A. Maiz, L. A. Aguado, Miquel Roca |
| 2000 | Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures. | Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, Ph. Cheynet, Bogdan Nicolescu, Raoul Velazco |
| 2000 | An Overview of the Applications of a Pulsed Laser System for SEU Testing. | Vincent Pouget, Pascal Fouillat, Dean Lewis, Herv Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet |
| 2000 | New Techniques for Accelerating Fault Injection in VHDL Descriptions. | B. Parrotta, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante |