| 1999 | Changing our Path to High Level ATPG. | Scott Davidson |
| 1999 | The value of tester accuracy. | Wajih Dalal, Song Miao |
| 1999 | Estimating the integral non-linearity of A/D-converters via the frequency domain. | Nico Csizmadia, Augustus J. E. M. Janssen |
| 1999 | The testability features of the 3rd generation ColdFire family of microprocessors. | Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran |
| 1999 | High speed digital transceivers: A challenge for manufacturing. | Clifford B. Cole, Thomas P. Warwick |
| 1999 | Test generation for crosstalk-induced delay in integrated circuits. | Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | High time for high level ATPG. | Wu-Tung Cheng |
| 1999 | Fault modeling of suspended thermal MEMS. | Benot Charlot, Salvador Mir, rika F. Cota, Marcelo Lubaszewski, Bernard Courtois |
| 1999 | On-line fault detection in DSP circuits using extrapolated checksums with minimal test points. | Sudip Chakrabarti, Abhijit Chatterjee |
| 1999 | Towards a standardized procedure for automatic test equipment timing accuracy evaluation. | Yi Cai, William R. Ortner, C. T. Garrenton |
| 1999 | A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. | Kenneth M. Butler |
| 1999 | Increasing Test Coverage in a VLSI Design Course. | Michael L. Bushnell |
| 1999 | Probe contact resistance variations during elevated temperature wafer test. | Jerry J. Broz, Reynaldo M. Rincon |
| 1999 | Design for In-System Programming. | David A. Bonnett |
| 1999 | An on-line BISTed SRAM IP core. | Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto |
| 1999 | STIL: the device-oriented database for the test development lifecycle. | Nathan Biggs |
| 1999 | Static component interconnect test technology (SCITT) a new technology for assembly testing. | Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg |
| 1999 | An algorithm for row-column self-repair of RAMs and its implementation in the Alpha 21264. | Dilip K. Bhavsar |
| 1999 | Testing an MCM for high-energy physics experiments: a case study. | Alfredo Benso, Silvia Chiusano, Paolo Prinetto, Simone Giovannetti, Riccardo Mariani, Silvano Motto |
| 1999 | HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs. | Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian |
| 1999 | Test features of a core-based co-processor array for video applications. | Jos van Beers, Harry Van Herten |
| 1999 | IMEMS accelerometer testing-test laboratory development and usage. | Richard W. Beegle, Robert W. Brocato, Ronald W. Grant |
| 1999 | Embedded X86 testing methodology. | Luis Basto, Asif Khan, Pete Hodakievic |
| 1999 | Test process optimization: closing the gap in the defect spectrum. | Norma Barrett, Simon Martin, Chryssa Dislis |
| 1999 | Correlation of logical failures to a suspect process step. | Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith |