IEEE International Test Conference

ITC

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Best Computer Systems Engineering conferences

Papers per year

1981207 peak2025

Most published authors

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2013	SmartScan - Hierarchical test compression for pin-limited low power designs.	Krishna Chakravadhanula, Vivek Chickermane, Don Pearl, Akhil Garg, R. Khurana, Subhasish Mukherjee, P. Nagaraj
2013	Fault mitigation strategies for CUDA GPUs.	Stefano Di Carlo, Giulio Gambardella, Ippazio Martella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta
2013	A distributed-multicore hybrid ATPG system.	X. Cai, Peter Wohl
2013	12Gbps SerDes Jitter Tolerance BIST in production loopback testing with enhanced spread spectrum clock generation circuit.	Yi Cai, Liming Fang, Ivan Chan, Max Olsen, Kevin Richter
2013	Keynote address thursday: Efficient resilience in future systems: Design and modeling challenges.	Pradip Bose
2013	Keynote address wednesday: Compute continuum and the nonlinear validation challenge.	John D. Barton
2013	In-system diagnosis of RF ICs for tolerance against on-chip in-band interferers.	Naoya Azuma, T. Makita, S. Ueyama, Makoto Nagata, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Satoshi Tanaka, Masahiro Yamaguchi
2013	A design-for-reliability approach based on grading library cells for aging effects.	Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
2013	A graph-theoretic approach for minimizing the number of wrapper cells for pre-bond testing of 3D-stacked ICs.	Mukesh Agrawal, Krishnendu Chakrabarty
2013	True non-intrusive sensors for RF built-in test.	Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
2012	Low-power SRAMs power mode control logic: Failure analysis and test solutions.	Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012	Algorithm for dramatically improved efficiency in ADC linearity test.	Zhongjun Yu, Degang Chen
2012	A built-in self-test scheme for 3D RAMs.	Yun-Chao You, Che-Wei Chou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu
2012	Testing strategies for a 9T sub-threshold SRAM.	Hao-Yu Yang, Chen-Wei Lin, Hung-Hsin Chen, Mango Chia-Tso Chao, Ming-Hsien Tu, Shyh-Jye Jou, Ching-Te Chuang
2012	A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation.	Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue
2012	A memory yield improvement scheme combining built-in self-repair and error correction codes.	Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang
2012	Hybrid selector for high-X scan compression.	Peter Wohl, John A. Waicukauski, Frederic Neuveux, Jonathon E. Colburn
2012	On pinpoint capture power management in at-speed scan test generation.	Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
2012	Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements.	Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor
2012	Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters.	Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee
2012	Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction.	Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage
2012	Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization.	Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee
2012	An experiment of burn-in time reduction based on parametric test analysis.	Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2012	Screening customer returns with multivariate test analysis.	Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2012	Root cause identification of an hard-to-find on-chip power supply coupling fail.	Franco Stellari, Thomas Cowell, Peilin Song, Michael Sorna, Zeynep Toprak Deniz, John F. Bulzacchelli, Nandita A. Mitra

851–875 of 4,920← Previous Next →

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