| 2009 | A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. | Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann |
| 2009 | Fault diagnosis for embedded read-only memories. | Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2009 | Compression based on deterministic vector clustering of incompatible test cubes. | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer |
| 2009 | Running scan test on three pins: yes we can! | Jocelyn Moreau, Thomas Droniou, Philippe Lebourg, Paul Armagnat |
| 2009 | NAND flash testing: A preliminary study on actual defects. | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benot Godard |
| 2009 | Testing 3D chips containing through-silicon vias. | Erik Jan Marinissen, Yervant Zorian |
| 2009 | A timestamping method using reduced cost ADC hardware. | Timothy D. Lyons |
| 2009 | A novel array-based test methodology for local process variation monitoring. | Tseng-Chin Luo, Mango Chia-Tso Chao, Michael S.-Y. Wu, Kuo-Tsai Li, Chin C. Hsia, Huan-Chi Tseng, Chuen-Uan Huang, Yuan-Yao Chang, Samuel C. Pan, Konrad K.-L. Young |
| 2009 | Eliminating product infant mortality failures using prognostic analysis. | Len Losik |
| 2009 | Trace signal selection for debugging electrical errors in post-silicon validation. | Xiao Liu, Qiang Xu |
| 2009 | On simultaneous shift- and capture-power reduction in linear decompressor-based test compression environment. | Xiao Liu, Qiang Xu |
| 2009 | Test effectiveness evaluation through analysis of readily-available tester data. | Yen-Tzu Lin, Ronald D. Blanton |
| 2009 | An ant colony optimization technique for abstraction-guided state justification. | Min Li, Michael S. Hsiao |
| 2009 | Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes? | Adam W. Ley |
| 2009 | Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. | Adam W. Ley |
| 2009 | Enabling GSM/GPRS/EDGE EVM testing on low cost multi-site testers. | Bobby Lai, Chris Rivera, Khurram Waheed |
| 2009 | Cost-effective approach to improve EMI yield loss. | Hsuan-Chung Ko, Deng-Yao Chang, Cheng-Nan Hu |
| 2009 | A novel multisite testing techniques by using frequency synthesizer. | Boyon Kim, Il-Chan Park, Giseob Song, Wooseong Choi, Byeong-Yun Kim, Kyutaek Lee, Chi-Young Choi |
| 2009 | A development platform and electronic modules for automated test up to 20 Gbps. | David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme |
| 2009 | Built-in Self Test for Error Vector Magnitude measurement of RF transceiver. | Bilal El Kassir, Christophe Kelma, Bernard Jarry, Michel Campovecchio |
| 2009 | Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. | Sukeshwar Kannan, Bruce C. Kim |
| 2009 | Manufacturing data: Maximizing value using component-to-system analysis. | Matthias Kamm |
| 2009 | Test economics for homogeneous manycore systems. | Lin Huang, Qiang Xu |
| 2009 | Tolerance of performance degrading faults for effective yield improvement. | Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee |
| 2009 | Diagnostic test generation for transition faults using a stuck-at ATPG tool. | Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu |