| 2007 | Analyzing the risk of timing modeling based on path delay tests. | Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir |
| 2007 | An algorithm to evaluate wide-band quadrature mixers. | Koji Asami |
| 2007 | Automotive IC's: less testing, more prevention. | Davide Appello |
| 2007 | A comparative study of continuous sampling plans for functional board testing. | Jukka Antila, Timo Karhu |
| 2007 | On using lossless compression of debug data in embedded logic analysis. | Ehab Anis, Nicola Nicolici |
| 2007 | Cost effective manufacturing test using mission mode tests. | Parmod Aggarwal |
| 2007 | Low cost characterization of RF transceivers through IQ data analysis. | Erkan Acar, Sule Ozev |
| 2007 | Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. | Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy |
| 2006 | BIST Power Reduction Using Scan-Chain Disable in the Cell Processor. | Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mding, Jens Leenstra |
| 2006 | Evaluating and Improving Transient Error Tolerance of CMOS Digital VLSI Circuits. | Chong Zhao, Sujit Dey |
| 2006 | ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE. | Fengming Zhang, Warren Necoechea |
| 2006 | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. | Hyunbean Yi, Jaehoon Song, Sungju Park |
| 2006 | Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier. | Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin |
| 2006 | Multi Strobe Circuit for 2.133GHz Memory Test System. | Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu, Hirokatsu Niijima, Koichi Tanaka |
| 2006 | A Study of Per-Pin Timing Jitter Scope. | Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma |
| 2006 | Perfect data reconstruction algorithm of time interleaved ADCs. | Fang Xu |
| 2006 | A High Speed Reduced Pin Count JTAG Interface. | Lee Whetsel |
| 2006 | Power Supply Noise in Delay Testing. | Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger |
| 2006 | Design for Board and System Level Structural Test and Diagnosis. | Toai Vo, Zhiyuan Wang, Ted Eaton, Pradipta Ghosh, Huai Li, Young Lee, Weili Wang, Hong Shin Jun, Rong Fang, Dan Singletary, Xinli Gu |
| 2006 | Test Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques. | Stefan Vock, Markus Schmid, Hans Martin von Staudt |
| 2006 | Novel Architecture for On-Chip AC Characterization of I/Os. | N. Vijayaraghavan, Balwant Singh, Saurabh Singh, Vishal Srivastava |
| 2006 | A Reconfigurable Built-In Self-Repair Scheme for Multiple Repairable RAMs in SOCs. | Tsu-Wei Tseng, Jin-Fu Li, Chih-Chiang Hsu, Alex Pao, Kevin Chiu, Eliot Chen |
| 2006 | Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. | Sylvain Tourangeau, Bill Eklow |
| 2006 | On-chip Test and Repair of Memories for Static and Dynamic Faults. | Sanjay K. Thakur, Rubin A. Parekhji, Arun N. Chandorkar |
| 2006 | Prospects for Wafer-Level Testing of Gigascale Chips with Electrical and Optical I/O Interconnects. | Hiren D. Thacker, James D. Meindl |