| 2005 | "Driver on a floppy" delivery of ATE instrumentation software. | Dan Proskauer |
| 2005 | Chasing subtle embedded RAM defects for nanometer technologies. | Theo J. Powell, Amrendra Kumar, Joseph Rayhawk, Nilanjan Mukherjee |
| 2005 | Forming N-detection test sets from one-detection test sets without test generation. | Irith Pomeranz, Sudhakar M. Reddy |
| 2005 | Transient fault characterization in dynamic noisy environments. | Ilia Polian, John P. Hayes, Sandip Kundu, Bernd Becker |
| 2005 | Test implications of lead-free implementation in a high-volume manufacturing environment. | Shu Peng, Sam Wong |
| 2005 | Word line pulsing technique for stability fault detection in SRAM cells. | Andrei Pavlov, Mohamed Azimane, Jos Pineda de Gyvez, Manoj Sachdev |
| 2005 | Testing throughput computing interconnect topologies with Tbits/sec bandwidth in manufacturing and in field. | Ishwar Parulkar, Dawei Huang, Leandro Chua Jr., Drew Doblar |
| 2005 | A 16-bit resistor string DAC with full-calibration at final test. | Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger |
| 2005 | A new probing technique for high-speed/high-density printed circuit boards. | Kenneth P. Parker |
| 2005 | Bead probes in practice. | Kenneth P. Parker |
| 2005 | The effects of defects on high-speed boards. | Kenneth P. Parker |
| 2005 | High speed differential pin electronics over 6.4 Gbps. | Atsushi Oshima, Toshihiro Nomura |
| 2005 | Analysis of pseudo-interleaving AWG. | Hideo Okawara |
| 2005 | Optimized reasoning-based diagnosis for non-random, board-level, production defects. | Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow |
| 2005 | Power-supply noise in SoCs: ATPG, estimation and control. | Mehrdad Nourani, Arun Radhakrishnan |
| 2005 | Burn-in reduction using principal component analysis. | Amit Nahar, W. Robert Daasch, Suresh Subramaniam |
| 2005 | Business constraints drive test decisions. | Fidel Muradali |
| 2005 | Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring. | Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy |
| 2005 | A random access scans architecture to reduce hardware overhead. | Anand S. Mudlapur, Vishwani D. Agrawal, Adit D. Singh |
| 2005 | Diagnosis with convolutional compactors in presence of unknown states. | Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2005 | Simulation of transients caused by single-event upsets in combinational logic. | Kartik Mohanram |
| 2005 | Logic soft errors: a major barrier to robust platform design. | Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim |
| 2005 | A leakage control system for thermal stability during burn-in test. | Mesut Meterelliyoz, Hamid Mahmoodi, Kaushik Roy |
| 2005 | A methodology for testing one-hot transmission gate multiplexers. | Teresa L. McLaurin, Frank Frederick, Rich Slobodnik |
| 2005 | STIL persistence [data reduction]. | Greg Maston, Julie Villar |