| 2004 | Security vs. Test Quality: Are they mutually exclusive? | Rohit Kapur |
| 2004 | "Real Life" System Testing of Networking Equipment. | Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein |
| 2004 | Removing JTAG Bottlenecks in System Interconnect Test. | Hong Shin Jun, Sung Soo Chung, Sang H. Baeg |
| 2004 | To Test or To Inspect, What is the Coverage? | Rob Jukna |
| 2004 | Options for High-Volume Test of Multi-GB/s Ports. | John C. Johnson |
| 2004 | Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. | Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger |
| 2004 | Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models. | Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer |
| 2004 | Data Mining Integrated Circuit Fails with Fail Commonalities. | Leendert M. Huisman, Maroun Kassab, Leah Pastel |
| 2004 | Routability and Fault Tolerance of FPGA Interconnect Architectures. | Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi |
| 2004 | Non-Deterministic DUT Behavior During Functional Testing of High Speed Serial Busses: Challenges and Solutions. | Jonathan Hops, Brian Swing, Brian Phelps, Bruce Sudweeks, John Pane, James Kinslow |
| 2004 | BER Estimation for Serial Links Based on Jitter Spectrum and Clock Recovery Characteristics. | Dongwoo Hong, Chee-Kian Ong, Kwang-Ting (Tim) Cheng |
| 2004 | Test Strategies For a 40Gbps Framer SoC. | Hans T. Heineken, Jitendra Khare |
| 2004 | Implementation of an Economic Jitter Compliance Test for a Multi-Gigabit Device on ATE. | Gert Hansel, Korbinian Stieglbauer |
| 2004 | A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4. | Juha Hkkinen, Pekka Syri, Juha-Veikko Voutilainen, Markku Moilanen |
| 2004 | A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. | Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sbastien Laberge, Gordon W. Roberts |
| 2004 | Glamorous Analog Testability - We Already Test them and Ship Them - So What is the Problem? | Mohamed Hafed |
| 2004 | Power Supply Ramping for Quasi-static Testing of PLLs. | Jos Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller |
| 2004 | Realizing High Test Quality Goals with Smart Test Resource Usage. | Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski |
| 2004 | ALAPTF: A new Transition Faultmodel and the ATPG Algorithm. | Puneet Gupta, Michael S. Hsiao |
| 2004 | Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. | Ad J. van de Goor, Said Hamdioui, Rob Wadsworth |
| 2004 | Low Overhead Delay Testing of ASICS. | Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley |
| 2004 | Reducing Power Consumption in Memory ECC Checkers. | Shalini Ghosh, Nur A. Touba, Sugato Basu |
| 2004 | Efficient Pattern Mapping for Deterministic Logic BIST. | Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers |
| 2004 | System Monitor for Diagnostic, Calibration and System Configuration. | Maurizio Gavardoni, Michael Jones, Russell Poffenberger, Miguel Conde |
| 2004 | Diagnosis Meets Physical Failure Analysis: How Long can we Succeed? | Anne E. Gattiker |