| 2004 | Electronic circuit comprising a secret sub-module. | Hrv Fleury |
| 2004 | Simulation Based System Level Fault Insertion Using Co-verification Tools. | Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau |
| 2004 | What Do You Mean My Board Test Stinks? | Bill Eklow |
| 2004 | Extending STIL 1450 Standard for Test Program Flow. | David Dowding, Ernie Wahl, Don Organ |
| 2004 | Formal Description of Test Specification and ATE Architecture for Mixed-Signal Test. | Baolin Deng, Wolfram Glauert |
| 2004 | Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing. | Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham, Manuel A. d'Abreu |
| 2004 | Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer. | Foster F. Dai, Charles E. Stroud, Dayu Yang, Shuying Qi |
| 2004 | Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. | W. Robert Daasch, Manu Rehani |
| 2004 | Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. | Alfred L. Crouch |
| 2004 | Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance in Automotive Systems. | Fulvio Corno, Matteo Sonza Reorda, Simonluca Tosato, F. Esposito |
| 2004 | Global Failure Localization: We Have To, But on What and How? | Edward I. Cole Jr. |
| 2004 | A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems. | C. J. Clark, Mike Ricchetti |
| 2004 | Channel Masking Synthesis for Efficient On-Chip Test Compression. | Vivek Chickermane, Brian Foutz, Brion L. Keller |
| 2004 | Architectures of Increased Availability Wireless Sensor Network Nodes. | Man Wah Chiang, Zeljko Zilic, Jean-Samuel Chenard, Katarzyna Radecka |
| 2004 | Testing and Remote Field Update of Distributed Base Stations in a Wireless Network. | Chen-Huan Chiang, Paul J. Wheatley, Kenneth Y. Ho, Ken L. Cheung |
| 2004 | An SOC Test Integration Platform and Its Industrial Realization. | Kuo-Liang Cheng, Jing-Reng Huang, Chih-Wea Wang, Chih-Yen Lo, Li-Ming Denq, Chih-Tsun Huang, Shin-Wei Hung, Jye-Yuan Lee |
| 2004 | A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
| 2004 | Decision Selection and Learning for an All-Solutions ATPG Engine. | Kameshwar Chandrasekar, Michael S. Hsiao |
| 2004 | Defect Coverage Analysis of Partitioned Testing. | Sreejit Chakravarty, Eric W. Savage, Eric N. Tran |
| 2004 | Feed Forward Test Methodology Utilizing Device Identification. | A. Cabbibo, J. Conder, M. Jacobs |
| 2004 | Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. | Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington |
| 2004 | Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. | Kenneth M. Butler |
| 2004 | RF Testing on a Mixed Signal Tester. | Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat |
| 2004 | CAEN-BIST: Testing the NanoFabric. | Jason G. Brown, R. D. (Shawn) Blanton |
| 2004 | Speed Clustering of Integrated Circuits. | Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra |