| 2001 | Testing clock distribution circuits using an analytic signal method. | Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida |
| 2001 | Scan array solution for testing power and testing time. | Lei Xu, Yihe Sun, Hongyi Chen |
| 2001 | Algorithm level recomputing with allocation diversity: a register transfer level time redundancy based concurrent error detection technique. | Kaijie Wu, Ramesh Karri |
| 2001 | Shadow write and read for at-speed BIST of TDM SRAMs. | Yuejian Wu, Liviu Calin |
| 2001 | Design of compactors for signature-analyzers in built-in self-test. | Peter Wohl, John A. Waicukauski, Thomas W. Williams |
| 2001 | Low hardware overhead scan based 3-weight weighted random BIST. | Seongrnoon Wang |
| 2001 | Enhanced reduced pin-count test for full-scan design. | Harald P. E. Vranken, Tom Waayers, Hrv Fleury, David Lelouvier |
| 2001 | Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environment. | Jrg E. Vollrath, Randall Rooney |
| 2001 | Tackling test trade-offs from design, manufacturing to market using economic modeling. | Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff |
| 2001 | Test and debug strategy of the PNX8525 Nexperia | Bart Vermeulen, Steven Oostdijk, Frank Bouwman |
| 2001 | Rapid prototyping of time-based PDIT for substrate networks [MCM] . | Aranggan Venkataratnam, Kimberly E. Newman |
| 2001 | Modeling and testing the Gekko microprocessor, an IBM PowerPC derivative for Nintendo. | Gilbert Vandling |
| 2001 | Scan vs. functional testing - a comparative effectiveness study on Motorola's MMC2107 | Ken Tumin, Carmen Vargas, Ross Patterson, Chris Nappi |
| 2001 | Multiple-output propagation transition fault test. | Chao-Wen Tseng, Edward J. McCluskey |
| 2001 | Testing for resistive opens and stuck opens. | Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 2001 | A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly. | Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe |
| 2001 | A highly-efficient transparent online memory test. | Karl Thaller |
| 2001 | Dynamic tests in complex systems [automotive electronics]. | Robert Tappe, Dietmar Ehrhardt |
| 2001 | A method to improve SFDR with random interleaved sampling method. | Mamoru Tamba, Atsushi Shimizu, Hideharu Munakata, Takanori Komuro |
| 2001 | Configuration free SoC interconnect BIST methodology. | Chauchin Su, Wenliang Tseng |
| 2001 | Contactless digital testing of IC pin leakage currents. | Stephen K. Sunter, Charles McDonald, Givargis Danialy |
| 2001 | A general purpose 1149.4 IC with HF analog test capabilities. | Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh |
| 2001 | Remote access to engineering test-a case study in providing engineering/diagnostic IC test services to Canadian universities. | R. L. Stevenson, M. E. Jarosz, C. V. Verver |
| 2001 | FedEx - a fast bridging fault extractor. | Zoran Stanojevic, D. M. H. Walker |
| 2001 | On efficient error diagnosis of digital circuits. | Nandini Sridhar, Michael S. Hsiao |