IEEE VLSI Test Symposium
VTS
National
CORE rank
CORE rank (raw)
National/Regional
Fields of research
Computer Systems Engineering
Papers indexed
2,208
1991–2026
Papers per year
199189 peak2026
Most published authors
VTS papers
2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2022 | Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits. | Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal |
| 2022 | Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. | Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy |
| 2022 | NVIDIA MATHS: Mechanism to Access Test-Data over High-Speed Links. | Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Kaushik Narayanun, Shantanu Sarangi, Francisco Da Silva, Joe Sarmiento, Smbat Tonoyan, Ashwin Chintaluri, Animesh Khare, Milind Sonawane, Ashish Kumar, Anitha Kalva, Alex Hsu, Jayesh Pandey |
| 2022 | A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. | Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard |
| 2022 | Innovation Practices Track: Silicon Telemetry for Dependability. | Fei Su, Stephen Crosher, Andrea Matteucci, Yuwen Zou |
| 2022 | Innovative Practices Track: Next Generation Test Standards. | Arani Sinha |
| 2022 | Innovative Practices Track: Silent Data Errors. | Arani Sinha |
| 2022 | Special Session: Calibrating mismatch in an ISFET with a Floating-Gate. | Sahil Shah, Jennifer Blain Christen |
| 2022 | Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware. | Mehdi Sadi, Yi He, Yanjing Li, Mahabubul Alam, Satwik Kundu, Swaroop Ghosh, Javad Bahrami, Naghmeh Karimi |
| 2022 | Innovation Practices Track: Security in Test and Test for Security. | Gang Qu, Benjamin Tan, Kuheli Pratihar, Debdeep Mukhopadhyay, Ramesh Karri |
| 2022 | Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. | Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee |
| 2022 | Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs. | Antonios Pavlidis, Eric Faehn, Marie-Minerve Lourat, Haralampos-G. Stratigopoulos |
| 2022 | Innovative Practices Track: New Methods for System Level Test of Image Projection and Radar VLSI Systems. | Rubin A. Parekhji |
| 2022 | Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. | Renjian Pan, Xin Li, Krishnendu Chakrabarty |
| 2022 | Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O. | Amit Pandey, Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, Karthikeyan Natarajan, Rahul Singhal |
| 2022 | Special Session: Test Impact of Multi-Die Packages. | Vineet Pancholi |
| 2022 | Innovative Practices Track: High Speed Test Fabric. | Bala Tarun Nelapatla, Rahul Singhal, Michael Daub, Zoran Stanojevics |
| 2022 | Machine Learning-Based Overkill Reduction through Inter-Test Correlation. | Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris |
| 2022 | MBIST-based Trim-Search Test Time Reduction for STT-MRAM. | Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2022 | On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). | Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas M. Satheesh, Kuo Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz |
| 2022 | A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection. | Marcel Merten, Sebastian Huhn, Rolf Drechsler |
| 2022 | Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous USB Type-C Receptacle. | Sankaran M. Menon, Rolf Khnis |
| 2022 | Voltage Tuning for Reliable Computation in Emerging Resistive Memories. | Mahta Mayahinia, Atousa Jafari, Mehdi B. Tahoori |
| 2022 | Innovative Practices Track: Innovative Analog Circuit Testing Technologies. | Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragn, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa |
| 2022 | Methods for testing path delay and static faults in RSFQ circuits. | Mingye Li, Fangzhou Wang, Sandeep Gupta |
251–275 of 2,208← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design