| 2022 | Special Session: Fault-Tolerant Deep Learning: A Hierarchical Perspective. | Cheng Liu, Zhen Gao, Siting Liu, Xuefei Ning, Huawei Li, Xiaowei Li |
| 2022 | Special Session: Effective In-field Testing of Deep Neural Network Hardware Accelerators. | Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Kanad Basu |
| 2022 | FSMx: Finite State Machine Extraction from Flattened Netlist With Application to Security. | Rasheed Kibria, Nusrat Farzana, Farimah Farahmandi, Mark Tehranipoor |
| 2022 | Fast Test Generation for Structurally Similar Circuits. | Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski |
| 2022 | Rule Generation for Classifying SLT Failed Parts. | Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao |
| 2022 | Special Session: Testing and Characterization for Large-Scale Programmable Analog Systems. | Jennifer Hasler |
| 2022 | Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. | Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen |
| 2022 | A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages. | Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda |
| 2022 | Innovative Practices Track: Test of 3D ICs & Chiplets. | Sandeep Kumar Goel, Sandeep Pendharkar, Chunsheng Liu |
| 2022 | Special Session: STT-MRAMs: Technology, Design and Test. | Anteneh Gebregiorgis, Lizhou Wu, Christopher Mnch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui |
| 2022 | All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. | Mona Ganji, Marampally Saikiran, Degang Chen |
| 2022 | The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. | Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen |
| 2022 | Special Session: A Testability Practitioner's Guide to Chiplets. | Abram Detofsky |
| 2022 | Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems. | Shail Dave, Alberto Marchisio, Muhammad Abdullah Hanif, Amira Guesmi, Aviral Shrivastava, Ihsen Alouani, Muhammad Shafique |
| 2022 | Special Session: Fault Criticality Assessment in AI Accelerators. | Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty |
| 2022 | Innovative Practices Track: Novel Methods for Validation and Test. | Nitin Chaudhary |
| 2022 | FIFO Topology Aware Stalling for Accelerating Coverage Convergence of Stalling Regressions. | Debarshi Chatterjee, Parth Lathigara, Siddhanth Dhodhi, Chad Parsons |
| 2022 | Special Session: A Call to Standardize Chip-let Interconnect Testing. | Sreejit Chakravarty |
| 2022 | Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. | Riccardo Cantoro, Francesco Garau, Riccardo Masante, Sandro Sartoni, Virendra Singh, Matteo Sonza Reorda |
| 2022 | Memristor-Specific Failures: New Verification Methods and Emerging Test Problems. | Baishakhi Rani Biswas, Sandeep Gupta |
| 2022 | Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components. | Bora Bilgic, Sule Ozev |
| 2022 | Fast RF Mismatch Calibration Using Built-in Detectors. | Muslum Emir Avci, Sule Ozev, Y. B. Chethan Kumar |
| 2022 | Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration. | Soyed Tuhin Ahmed, Mehdi B. Tahoori |
| 2021 | Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs). | Jinhua Zhu, Zhen Gao, Jie Jin, Pedro Reviriego |
| 2021 | Defect Characterization and Testing of Skyrmion-Based Logic Circuits. | Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal |