| 2021 | Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks. | Cheng-Hao Yang, Chia-Heng Yen, Ting-Rui Wang, Chun-Teng Chen, Mason Chern, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao |
| 2021 | TSV Fault Modeling and A BIST Solution for TSV Pre-bond Test. | Kangkang Xu, Yang Yu, Xiyuan Peng |
| 2021 | On Workload-Aware DRAM Failure Prediction in Large-Scale Data Centers. | Xingyi Wang, Yu Li, Yiquan Chen, Shiwen Wang, Yin Du, Cheng He, Yuzhong Zhang, Pinan Chen, Xin Li, Wenjun Song, Qiang Xu, Li Jiang |
| 2021 | Design for Testability of Low Dropout Regulators. | Anurag Tulsiram, William R. Eisenstadt |
| 2021 | On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. | Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch |
| 2021 | Automated Observability Analysis for Mixed-Signal Circuits. | Stephen Sunter, Krzysztof Jurga |
| 2021 | Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. | Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jrg Henkel, Hussam Amrouch |
| 2021 | Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
| 2021 | Compact Set of LFSR Seeds for Diagnostic Tests. | Irith Pomeranz |
| 2021 | Hybrid Methodology for Verification of SW Safety Mechanisms. | Sarvesh Patankar, Sainath Karlapalem, Sakshi Biyani, Wen Chen, Roman Chovanec, Martin Vlk, Martin Kaspar |
| 2021 | Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2021 | Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems. | Renjian Pan, Xin Li, Krishnendu Chakrabarty |
| 2021 | Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation. | V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, E. De La Rosa, C. Alleyne, S. Mier, Yiorgos Makris |
| 2021 | GATPS: An attention-based graph neural network for predicting SDC-causing instructions. | Junchi Ma, Zongtao Duan, Lei Tang |
| 2021 | A Hybrid Protection Scheme for Reconfigurable Scan Networks. | Natalia Lylina, Ahmed Atteya, Hans-Joachim Wunderlich |
| 2021 | Timing Critical Path Validation for Intel ATOM Cores Using Structural Test. | Wei Li, Shih-Yu Yang, Khen Wee, Ricardo Sanchez, Jay Desai, Kun-Han Tsai, Xijiang Lin |
| 2021 | Special Session - Test for AI Chips: from DFT to On-line Testing. | Huawei Li, Xiaowei Li, Yu Huang, Ying Wang, Gary Guo |
| 2021 | Algorithm to Architecture to RTL to GDSII: Incorporating Security into All Phases of SoC Design and Implementation Flow - Keynote. | Serge Leef |
| 2021 | Special Session: Reliability Analysis for AI/ML Hardware. | Shamik Kundu, Kanad Basu, Mehdi Sadi, Twisha Titirsha, Shihao Song, Anup Das, Ujjwal Guin |
| 2021 | An Energy-Efficient Approximate Systolic Array Based on Timing Error Prediction and Prevention. | Ning-Chi Huang, Wei-Kai Tseng, Huan-Jan Chou, Kai-Chiang Wu |
| 2021 | SAIF: Automated Asset Identification for Security Verification at the Register Transfer Level. | Nusrat Farzana, Avinash Ayalasomayajula, Fahim Rahman, Farimah Farahmandi, Mark Tehranipoor |
| 2021 | Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis. | Chenlei Fang, Qicheng Huang, R. D. Shawn Blanton |
| 2021 | Deep Stalling using a Coverage Driven Genetic Algorithm Framework. | Siddhanth Dhodhi, Debarshi Chatterjee, Eric Hill, Saad Godil |
| 2021 | New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core. | Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matthias Sauer, Bernd Becker, Matteo Sonza Reorda |
| 2021 | Combining Architectural Simulation and Software Fault Injection for a Fast and Accurate CNNs Reliability Evaluation on GPUs. | Josie E. Rodriguez Condia, Fernando Fernandes dos Santos, Matteo Sonza Reorda, Paolo Rech |