| 2021 | Special Session: Operating Systems under test: an overview of the significance of the operating system in the resiliency of the computing continuum. | Emmanuel Casseau, Petr Dobis, Oliver Sinnen, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Alessandro Savino, Stefano Di Carlo, Maurizio Rebaudengo, Alberto Bosio |
| 2021 | Special Session: Noisy Intermediate-Scale Quantum (NISQ) Computers - How They Work, How They Fail, How to Test Them? | Sebastian Brandhofer, Simon J. Devitt, Thomas Wellens, Ilia Polian |
| 2021 | Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications. | Srikanth Beerla, Miguel Costa |
| 2021 | Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration. | Ishaan Bassi, Sule Ozev, Doohwang Chang |
| 2021 | Edge Computing Trends, Design and Test Challenges - Keynote. | Karim Arabi |
| 2021 | Special Session: Machine Learning for Semiconductor Test and Reliability. | Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan |
| 2021 | Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities. | Elham Amini, Kai Bartels, Christian Boit, Marius Eggert, Norbert Herfurth, Tuba Kiyan, Thilo Krachenfels, Jean-Pierre Seifert, Shahin Tajik |
| 2021 | Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. | Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2021 | Special Session: CAD for Hardware Security - Automation is Key to Adoption of Solutions. | Sohrab Aftabjahani, Ryan Kastner, Mark Tehranipoor, Farimah Farahmandi, Jason Oberg, Anders Nordstrom, Nicole Fern, Alric Althoff |
| 2021 | Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. | Om Prakash, Chetan K. Dabhi, Yogesh Singh Chauhan, Hussam Amrouch |
| 2020 | Aging-resilient SRAM design: an end-to-end framework. | Xuan Zuo, Sandeep K. Gupta |
| 2020 | Special Session: The Recent Advance in Hardware Implementation of Post-Quantum Cryptography. | Jiafeng Xie, Kanad Basu, Kris Gaj, Ujjwal Guin |
| 2020 | Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing. | Dong Xiang, Jiaming Cai, Bo Liu |
| 2020 | A Zero-Cost Detection Approach for Recycled ICs using Scan Architecture. | Wendong Wang, Ujjwal Guin, Adit D. Singh |
| 2020 | A New Secure Scan Design with PUF-based Key for Authentication. | Qidong Wang, Aijiao Cui, Gang Qu, Huawei Li |
| 2020 | LSTM-based Analysis of Temporally- and Spatially-Correlated Signatures for Intermittent Fault Detection. | Xingyi Wang, Li Jiang, Krishnendu Chakrabarty |
| 2020 | Special Session: Physically Flexible Devices for Health and Activity Monitoring: Challenges from Design to Test. | Yigit Tuncel, Ganapati Bhat, mit Y. Ogras |
| 2020 | Flush+Time: A High Accuracy and High Resolution Cache Attack On ARM-FPGA Embedded SoC. | Churan Tang, Pengkun Liu, Cunqing Ma, Zongbin Liu, Jingquan Ge |
| 2020 | Special Session: Survey of Test Point Insertion for Logic Built-in Self-test. | Yang Sun, Spencer K. Millican, Vishwani D. Agrawal |
| 2020 | Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits. | Brett Sparkman, Scott C. Smith, Jia Di |
| 2020 | Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Snchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer |
| 2020 | ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric. | Mustafa Munawar Shihab, Bharath Ramanidharan, Suraag Sunil Tellakula, Gaurav Rajavendra Reddy, Jingxiang Tian, Carl Sechen, Yiorgos Makris |
| 2020 | Switch Level Time Simulation of CMOS Circuits with Adaptive Voltage and Frequency Scaling. | Eric Schneider, Hans-Joachim Wunderlich |
| 2020 | DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain. | Shervin Roshanisefat, Hadi Mardani Kamali, Kimia Zamiri Azar, Sai Manoj Pudukotai Dinakarrao, Naghmeh Karimi, Houman Homayoun, Avesta Sasan |
| 2020 | Non-Masking Non-Robust Tests for Path Delay Faults. | Irith Pomeranz |