IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Best Computer Systems Engineering conferences

Papers per year

199189 peak2026

Most published authors

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2020	Input Test Data Volume Reduction Using Seed Complementation and Multiple LFSRs.	Irith Pomeranz
2020	Taming Combinational Trojan Detection Challenges with Self-Referencing Adaptive Test Patterns.	Chris Nigh, Alex Orailoglu
2020	Automated Design For Yield Through Defect Tolerance.	Suriyaprakash Natarajan, Andres F. Malavasi, Pascal Andreas Meinerzhagen
2020	Mitigating Read Failures in STT-MRAM.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2020	A Deterministic-Statistical Multiple-Defect Diagnosis Methodology.	Soumya Mittal, R. D. Shawn Blanton
2020	Sequence Triggered Hardware Trojan in Neural Network Accelerator.	Zizhen Liu, Jing Ye, Xing Hu, Huawei Li, Xiaowei Li, Yu Hu
2020	Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.	Somayeh Sadeghi Kohan, Sybille Hellebrand
2020	Special Session: Novel Attacks on Logic-Locking.	Ayush Jain, Ujjwal Guin, M. Tanjidur Rahman, Navid Asadizanjani, Danielle Duvalsaint, R. D. Shawn Blanton
2020	Innovative Test Practices in Asia.	Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama
2020	Special Session: Test Challenges in a Chiplet Marketplace.	Marc Hutner, R. Sethuram, Bapi Vinnakota, Dave Armstrong, A. Copperhall
2020	Co-Optimization of Grid-Based TAM Wire Routing and Test Scheduling with Reconfigurable Wrappers.	Jui-Hung Hung, Shih-Hsu Huang, Chun-Hua Cheng, Hsu-Yu Kao, Wei-Kai Cheng
2020	Innovative Practice on Wafer Test Innovations.	Dyi-Chung Hu, Hirohito Hashimoto, Li-Fong Tseng, Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Sean Y.-S. Chen, Jwu E. Chen, Clark Liu, Andrew Yi-Ann Huang
2020	Effective Design of Layout-Friendly EDT Decompressor.	Yu Huang, Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Jeffrey Mayer
2020	On Classification of Acceptable Images for Reliable Artificial Intelligence Systems: A Case Study on Pedestrian Detection.	Tong-Yu Hsieh, Pin-Xuan Wu, Chun-Chao Cheng
2020	Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.	Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2020	Reliability Evaluation of Turbo Decoders Implemented on SRAM-FPGAs.	Zhen Gao, Lingling Zhang, Ruishi Han, Pedro Reviriego, Zhiqiang Li
2020	Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.	Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2020	SeRFI: Secure Remote FPGA Initialization in an Untrusted Environment.	Adam Duncan, Adib Nahiyan, Fahim Rahman, Grant Skipper, Martin Swany, Andrew Lukefahr, Farimah Farahmandi, Mark Tehranipoor
2020	Selective Checksum based On-line Error Correction for RRAM based Matrix Operations.	Abhishek Das, Nur A. Touba
2020	A dynamic reconfiguration mechanism to increase the reliability of GPGPUs.	Josie E. Rodriguez Condia, Pierpaolo Narducci, Matteo Sonza Reorda, Luca Sterpone
2020	SafeTPU: A Verifiably Secure Hardware Accelerator for Deep Neural Networks.	Maria I. Mera Collantes, Zahra Ghodsi, Siddharth Garg
2020	CNN-based Stochastic Regression for IDDQ Outlier Identification.	Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao
2020	Internal I/O Testing: Definition and a Solution.	Sreejit Chakravarty, Fei Su, Indira A. Gohad, Sudheer V. Bandana, B. S. Adithya, Wei Ming Lim
2020	In-field Functional Test of CAN Bus Controllers.	Riccardo Cantoro, Sandro Sartoni, Matteo Sonza Reorda
2020	Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis.	Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Mnch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui

351–375 of 2,208← Previous Next →

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