| 2020 | SNIFU: Secure Network Interception for Firmware Updates in legacy PLCs. | Hadjer Benkraouda, Muhammad Ashif Chakkantakath, Anastasis Keliris, Michail Maniatakos |
| 2020 | ESL, Back-annotating Crosstalk Fault Models into High-level Communication Links. | Katayoon Basharkhah, Rezgar Sadeghi, Nooshin Nosrati, Zainalabedin Navabi |
| 2020 | Ultra-Wideband Modulation Signal Measurement Using Local Sweep Digitizing Method. | Koji Asami, Keisuke Kusunoki, Nobuhiro Shimizu, Yoshiyuki Aoki |
| 2019 | Test-Cost Reduction for 2.5D ICs Using Microspring Technology for Die Attachment and Rework. | Zhanwei Zhong, Tom B. Wrigglesworth, Eugene M. Chow, Krishnendu Chakrabarty |
| 2019 | Hardware-based Real-time Workload Forensics via Frame-level TLB Profiling. | Yunjie Zhang, Liwei Zhou, Yiorgos Makris |
| 2019 | A New Method for Software Test Data Generation Inspired by D-algorithm. | Jianwei Zhang, Sandeep K. Gupta, William G. J. Halfond |
| 2019 | ZeroScreen: A Novel Structure for IC Reliability Screening at Time-Zero. | Liting Yu, Xiaoxiao Wang |
| 2019 | Layout-Based Dual-Cell-Aware Tests. | Tse-Wei Wu, Dong-Zhen Lee, Yu-Hao Huang, Mango C.-T. Chao, Kai-Chiang Wu, Shu-Yi Kao, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee |
| 2019 | An Incremental Automatic Test Pattern Generation Method for Multiple Stuck-at Faults. | Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita |
| 2019 | Automatic Test Pattern Generation for timing verification and delay testing of RSFQ circuits. | Fangzhou Wang, Sandeep Gupta |
| 2019 | Wafer Pattern Recognition Using Tucker Decomposition. | Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa |
| 2019 | Analog Performance Locking through Neural Network-Based Biasing. | Georgios Volanis, Yichuan Lu, Sai Govinda Rao Nimmalapudi, Angelos Antonopoulos, Andrew Marshall, Yiorgos Makris |
| 2019 | Special Session: Reliability of Hardware-Implemented Spiking Neural Networks (SNN). | Elena-Ioana Vatajelu, Giorgio Di Natale, Lorena Anghel |
| 2019 | Defective Pixel Analysis for Image Sensor Online Diagnostic and Self-Healing. | Ghislain Takam Tchendjou, Emmanuel Simeu |
| 2019 | Innovative Design for Test in State-of-the-Art Analog Systems. | Hans Martin von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen |
| 2019 | Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. | Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan |
| 2019 | Hybrid Performance Modeling for Optimization of In-System-Structural-Test (ISST) Latency. | Milind Sonawane, Venkat Abilash Reddy Nerallapally, Alex Hsu, Shantanu Sarangi |
| 2019 | IP Session on Machine Learning Applications in IC Test-Related Tasks. | Ghada Sokar, Yassin Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos |
| 2019 | Special Session (New Topic): Emerging Computing and Testing Techniques. | Max M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois |
| 2019 | Silicon Proven Timing Signoff Methodology using Hazard-Free Robust Path Delay Tests. | Ankit Shah, Raman Nayyar, Arani Sinha |
| 2019 | Special Session: A Quality and Reliability Driven DFT and DFR Strategy for Automotive and Industrial Markets. | Malav Shah, Subhadeep Ghosh, Scott Martin |
| 2019 | Special Session: Countering IP Security threats in Supply chain. | Hassan Salmani, Tamzidul Hoque, Swarup Bhunia, Muhammad Yasin, Jeyavijayan (JV) Rajendran, Naghmeh Karimi |
| 2019 | Innovative Practices on IEEE 1687.xyz. | Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt |
| 2019 | Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults. | Irith Pomeranz, Vivek Chickermane, Srikanth Venkataraman |
| 2019 | Test Compaction Under Bounded Transparent-Scan. | Irith Pomeranz |