| 2019 | Cache Design for Yield-per-Area Maximization: Switchable Spare Columns with Disabling (SSC-Disable). | Soowang Park, Sandeep K. Gupta |
| 2019 | Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. | Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | Special Session: Photonic IC Testing - Challenges and Opportunities. | Manoj Niraula, Vipul Patel, Prakash Gothoskar, Attila Mekis, Gary Evans, Xuezhe Zheng |
| 2019 | Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle. | Ben Niewenhuis, Balaji Ravikumar, Zeye Liu, R. D. Shawn Blanton |
| 2019 | Machine Learning-based Noise Classification and Decomposition in RF Transceivers. | Deepika Neethirajan, Constantinos Xanthopoulos, Kiruba S. Subramani, Keith Schaub, Ira Leventhal, Yiorgos Makris |
| 2019 | Mixed Signal Design Validation Using Reinforcement Learning Guided Stimulus Generation for Behavior Discovery. | Barry John Muldrey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2019 | Online Millimeter Wave Phased Array Calibration Based on Channel Estimation. | Thomas Moon, Junfeng Guan, Haitham Hassanieh |
| 2019 | PCB Hardware Trojans: Attack Modes and Detection Strategies. | Matthew McGuire, mit Y. Ogras, Sule Ozev |
| 2019 | Innovative Practices on DFT for AI Chips. | Iris Ma, Hui King Lau, Joseph A. Reynick, Yu Huang |
| 2019 | Special Session: Delay Fault Testing - Present and Future. | Jubayer Mahmod, Spencer K. Millican, Ujjwal Guin, Vishwani D. Agrawal |
| 2019 | Leveraging Memory PUFs and PIM-based encryption to secure edge deep learning systems. | Wen Li, Ying Wang, Huawei Li, Xiaowei Li |
| 2019 | Board-Level Functional Fault Identification using Streaming Data. | Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | Shielding Logic Locking from Redundancy Attacks. | Leon Li, Alex Orailoglu |
| 2019 | Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs. | Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty |
| 2019 | Innovative Practices on Software and Hardware based Silicon Debug/Fault Isolation. | Amit Jakati, Manish Sharma, Joy Liao |
| 2019 | Special Session: In-System-Test (IST) Architecture for NVIDIA Drive-AGX Platforms. | Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Bonita Bhaskaran, Shashank Bajpai, Venkat Abilash Reddy Nerallapally, Jayesh Pandey, Sam Jiang |
| 2019 | Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. | Ahmed M. Y. Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi |
| 2019 | RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level. | Miao Tony He, Jungmin Park, Adib Nahiyan, Apostol Vassilev, Yier Jin, Mark Tehranipoor |
| 2019 | A Novel Graph Coloring Based Solution for Low-Power Scan Shift. | Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak |
| 2019 | Optimized Stress Testing for Flexible Hybrid Electronics Designs. | Hang Gao, Ganapati Bhat, mit Y. Ogras, Sule Ozev |
| 2019 | Diagnosis Outcome Preview through Learning. | Chenlei Fang, Qicheng Huang, Soumya Mittal, R. D. Shawn Blanton |
| 2019 | Innovative Practices on Automotive Test. | Wim Dobbelaere, Marco Restifo, Peter Sarson |
| 2019 | Layered-ECC: A Class of Double Error Correcting Codes for High Density Memory Systems. | Abhishek Das, Nur A. Touba |
| 2019 | A Graph Theory Approach towards IJTAG Security via Controlled Scan Chain Isolation. | Abhishek Das, Nur A. Touba |
| 2019 | A Comparative Study of Pre-bond TSV Test Methodologies. | Sourav Das, Fei Su, Sreejit Chakravarty |