IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Best Computer Systems Engineering conferences

Papers per year

199189 peak2026

Most published authors

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2019	A Secure and Low-overhead Active IC Metering Scheme.	Aijiao Cui, Yan Yang, Gang Qu, Huawei Li
2019	Innovate Practices on CyberSecurity of Hardware Semiconductor Devices.	Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song
2019	On Cyclic Scan Integrity Tests for EDT-based Compression.	Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer
2019	An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test.	Cheng Ban, Minshun Wu, Jiangtao Xu, Li Geng, Degang Chen
2019	Innovative Practices on In-System Test and Reliability of Memories.	S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
2019	Special Session: Does Approximation Make Testing Harder (or Easier)?	R. Iris Bahar, Ulya R. Karpuzcu, Sasa Misailovic
2019	Innovative Test Practices in Japan.	Yusuke Asada, Takahiko Shimizu, Yuji Gendai, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jiang-Lin Wei, Nene Kushita, Hirotaka Arai, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi
2019	Quality Obfuscation for Error-Tolerant and Adaptive Hardware IP Protection.	Abdulrahman Alaql, Tamzidul Hoque, Domenic Forte, Swarup Bhunia
2018	Modeling and test generation for combinational hardware Trojans.	Ziqi Zhou, Ujjwal Guin, Vishwani D. Agrawal
2018	Broadcast-based minimization of the overall access time for the IEEE 1687 network.	Zhanwei Zhong, Guoliang Li, Qinfu Yang, Jun Qian, Krishnendu Chakrabarty
2018	Analyzing and mitigating the impact of permanent faults on a systolic array based neural network accelerator.	Jeff Jun Zhang, Tianyu Gu, Kanad Basu, Siddharth Garg
2018	Special session on reliability and vulnerability of neuromorphic computing systems.	Shimeng Yu, Chenchen Liu, Wujie Wen, Yiran Chen
2018	Modeling attacks on strong physical unclonable functions strengthened by random number and weak PUF.	Jing Ye, Qingli Guo, Yu Hu, Huawei Li, Xiaowei Li
2018	Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology.	Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018	Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs.	Alessandro Vallero, Sotiris Tselonis, Dimitris Gizopoulos, Stefano Di Carlo
2018	Special session on BIST/calibration of A/MS devices.	Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson
2018	A built-in self-test technique for transmitter-only systems.	Maryam Shafiee, Jennifer N. Kitchen, Sule Ozev
2018	ATPG-based cost-effective, secure logic locking.	Abhrajit Sengupta, Mohammed Thari Nabeel, Muhammad Yasin, Ozgur Sinanoglu
2018	Special session: How approximate computing impacts verification, test and reliability.	Luks Sekanina, Zdenek Vascek, Alberto Bosio, Marcello Traiola, Paolo Rech, Daniel Oliveira, Fernando Fernandes, Stefano Di Carlo
2018	High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs.	Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner
2018	IP session on ISO26262 EDA.	Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson
2018	Group delay measurement of frequency down-converter devices using chirped RF modulated signal.	Peter Sarson, Tomonori Yanagida, Kosuke Machida
2018	Special session on quantum systems: Next challenges in design, test, integration.	Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois
2018	Enhanced hotspot detection through synthetic pattern generation and design of experiments.	Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris
2018	Special session on overcoming reliability and energy-efficiency challenges with silicon photonics for future manycore computing.	Sudeep Pasricha, Davide Bertozzi, Hui Li

426–450 of 2,208← Previous Next →

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