| 2018 | Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. | Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer |
| 2018 | NOIDA: Noise-resistant Intra-cell Diagnosis. | Soumya Mittal, R. D. (Shawn) Blanton |
| 2018 | Innovative practices on silicon photonics. | Roy Meade, Woosung Kim, Richard Otte, Eugene R. Atwood |
| 2018 | An oscillation-based test technique for on-chip testing of mm-wave phase shifters. | Marc Margalef-Rovira, Manuel J. Barragn, Ekta Sharma, Philippe Ferrari, Emmanuel Pistono, Sylvain Bourdel |
| 2018 | Special session on machine learning: How will machine learning transform test? | Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner |
| 2018 | Special session on bringing cores closer together: The wireless revolution in on-chip communication. | Terrence S. T. Mak, Hiroki Matsutani, Partha Pratim Pande |
| 2018 | Innovative practices on machine learning for emerging applications. | Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang |
| 2018 | Online information utility assessment for per-device adaptive test flow. | Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev |
| 2018 | Staggered ATPG with capture-per-cycle observation test points. | Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer |
| 2018 | IR drop prediction of ECO-revised circuits using machine learning. | Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-Cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang |
| 2018 | IC layout weak point effectiveness evaluation based on statistical methods. | Fang Lin, Ali Ahmadi, Kannan Sekar, Yan Pan, Ke Huang |
| 2018 | Innovative practices on functional testing and fault simulation for FuSa. | Anandh Krishnan, John van Gelder, Mayukh Bhattacharya, Sreejit Chakravarty, Prashant Goteti |
| 2018 | An inter-layer interconnect BIST solution for monolithic 3D ICs. | Abhishek Koneru, Krishnendu Chakrabarty |
| 2018 | Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. | Qutaiba Khasawneh, Jennifer Dworak, Ping Gui, Benjamin Williams, Alan C. Elliott, Anand Muthaiah |
| 2018 | Test challenges and solutions for emerging non-volatile memories. | Mohammad Nasim Imtiaz Khan, Swaroop Ghosh |
| 2018 | RF circuit authentication for detection of process Trojans. | Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, Sule Ozev |
| 2018 | Innovative practices on design & test for flexible hybrid electronics. | Tsung-Ching Jim Huang, Jason Marsh, Scott H. Goodwin, Dorota S. Temple |
| 2018 | Fast fault coverage estimation of sequential tests using entropy measurements. | Michael S. Hsiao, Sarmad Tanwir |
| 2018 | Hardware Trojan attacks in embedded memory. | Tamzidul Hoque, Xinmu Wang, Abhishek Basak, Robert Karam, Swarup Bhunia |
| 2018 | On-line monitoring and error correction in sensor interface circuits using digital calibration techniques. | Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen |
| 2018 | Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits. | Omar Al-Terkawi Hasib, Daniel Crepeau, Thomas Awad, Andrei Dulipovici, Yvon Savaria, Claude Thibeault |
| 2018 | Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. | Saurabh Gupta, Jae Wu, Jennifer Dworak |
| 2018 | Securing IJTAG against data-integrity attacks. | Rana Elnaggar, Ramesh Karri, Krishnendu Chakrabarty |
| 2018 | Innovative practices on quality levels of A/MS devices. | Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick |
| 2018 | Systematic b-adjacent symbol error correcting reed-solomon codes with parallel decoding. | Abhishek Das, Nur A. Touba |