| 2018 | Special session: Recent developments in hardware security. | Ro Cammarota, Naghmeh Karimi, Siddharth Garg, Jeyavijayan Rajendran |
| 2018 | A coherent subsampling test system arrangement suitable for phase domain measurements. | Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida |
| 2018 | Special session on machine learning for test and diagnosis. | Krishnendu Chakrabarty, Li-C. Wang, Gaurav Veda, Yu Huang |
| 2018 | Innovative practices on memory test practice. | M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla |
| 2018 | Special session on intelligent sensor nodes. | Kanad Basu, Shreyas Sen |
| 2018 | Innovative practices on test in Japan. | Koji Asami, Yoshiro Tamura, Haruo Kobayashi, Jun Matsushima, Yoichi Maeda, Kazumi Hatayama |
| 2018 | Innovative practices on challenges, opportunities, and solutions to hardware security. | Sohrab Aftabjahani, Jason Oberg, Michael Chen, Huawei Li |
| 2017 | Asymmetric sizing: An effective design approach for SRAM cells against BTI aging. | Xuan Zuo, Sandeep K. Gupta |
| 2017 | Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain. | Dongrong Zhang, Miao Tony He, Xiaoxiao Wang, Mark Tehranipoor |
| 2017 | HLDTL: High-performance, low-cost, and double node upset tolerant latch design. | Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang |
| 2017 | Test-set reordering for improving diagnosability. | Cheng Xue, R. D. (Shawn) Blanton |
| 2017 | A new delay testing signal scheme robust to power distribution network impedance variation. | Claude Thibeault, Ali Louati |
| 2017 | Adaptive test flow for mixed-signal ICs. | Haralampos-G. D. Stratigopoulos, Christian Streitwieser |
| 2017 | Innovative practices session 1C screening for layout sensitive defects. | Arani Sinha, Nitin Chaudhary |
| 2017 | Learning the process for correlation analysis. | Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg |
| 2017 | Leveraging Systematic Unidirectional Error-Detecting Codes for fast STT-MRAM cache. | Nour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2017 | A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm. | Peter Sarson, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi |
| 2017 | Innovative practices session 5C automotive test solutions. | Pete Sarson, Stefano Di Carlo |
| 2017 | Innovative practices session 7C automotive quality assurance. | Peter Sarson |
| 2017 | Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs. | Guillaume Renaud, Marc Margalef-Rovira, Manuel J. Barragn, Salvador Mir |
| 2017 | Innovative practices session 4A variation-tolerant design of circuits/systems. | Arijit Raychowdhury |
| 2017 | Innovative practices session 3C hardware security. | Jeyavijayan (JV) Rajendran, Peilin Song, Suriya Natarajan |
| 2017 | An optimised SDD ATPG and SDQL computation method across different pattern sets. | Wilson Pradeep, Prakash Narayanan, Rubin A. Parekhji |
| 2017 | Using piecewise-functional broadside tests for functional broadside test compaction. | Irith Pomeranz |
| 2017 | Fail data reduction for diagnosis of scan chain faults under transparent-scan. | Irith Pomeranz |