| 2017 | Innovative practices session 2C: "How is industry simplifying analog test". | Rubin A. Parekhji, Srinivas Modekurty |
| 2017 | Innovative practices session 4C data analytics in test. | Suriya Natarajan, Abhijit Sathaye |
| 2017 | On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers. | Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | Foreword. | Yiorgos Makris, Srivaths Ravi, Amit Majumdar |
| 2017 | Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact & remedies. | Yichuan Lu, Georgios Volanis, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris |
| 2017 | Aging monitor reuse for small delay fault testing. | Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2017 | Innovative practices session 10C formal verification practices in industry. | Huawei Li, Xiaowei Li |
| 2017 | Test-cost optimization in a scan-compression architecture using support-vector regression. | Zipeng Li, Jonathon E. Colburn, Vinod Pagalone, Kaushik Narayanun, Krishnendu Chakrabarty |
| 2017 | Fast WAT test structure for measuring Vt variance based on latch-based comparators. | Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Mango Chia-Tso Chao |
| 2017 | Fiscal: Firmware identification using side-channel power analysis. | Deepak Krishnankutty, Ryan W. Robucci, Nilanjan Banerjee, Chintan Patel |
| 2017 | A methodology for estimating memory lifetime using a system-level accelerated life test and error-correcting codes. | Dae-Hyun Kim, Linda Milor |
| 2017 | An analytical model for predicting the residual life of an IC and design of residual-life meter. | Md. Nazmul Islam, Sandip Kundu |
| 2017 | Structured scan patterns retargeting for dynamic instruments access. | Ahmed Ibrahim, Hans G. Kerkhoff |
| 2017 | Methodology of generating dual-cell-aware tests. | Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao |
| 2017 | Innovative practices session 11C SoC testing. | Yu Huang |
| 2017 | Innovative practices session 10B innovative practices in Asia-2: From cost perspective. | Kazumi Hatayama, Masahiro Ishida |
| 2017 | Innovative practices session 9B innovative practices in Asia-1: From quality perspective. | Kazumi Hatayama, Masahiro Ishida |
| 2017 | Keynote address tribute to Professor Mel Breuer: Contributions to CAD and Test. | Sandeep Gupta, Miron Abramovici, Magdy Abadir, Sridhar Narayanan |
| 2017 | A novel design-for-security (DFS) architecture to prevent unauthorized IC overproduction. | Ujjwal Guin, Ziqi Zhou, Adit D. Singh |
| 2017 | Innovative practices session 6C DFT for functional safety. | Prashant Goteti, Sreejit Chakravarty |
| 2017 | A framework for fast test generation at the RTL. | Kelson Gent, Akash Agrawal, Michael S. Hsiao |
| 2017 | Accurate jitter decomposition in high-speed links. | Yan Duan, Degang Chen |
| 2017 | Comprehensive investigation of gate oxide short in FinFETs. | Roya Dibaj, Dhamin Al-Khalili, Maitham Shams |
| 2017 | Special session on early life failures. | Jyotirmoy V. Deshmukh, Wolfgang Kunz, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2017 | Innovative practices session 9C DFT and data for diagnostics. | Kun Young Chung, Stefano Di Carlo |