IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Best Computer Systems Engineering conferences

Papers per year

199189 peak2026

Most published authors

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2017	Flip-flop clustering based trace signal selection for post-silicon debug.	Yun Cheng, Huawei Li, Ying Wang, Yingke Gao, Bo Liu, Xiaowei Li
2017	Performance-aware reliability assessment of heterogeneous chips.	Athanasios Chatzidimitriou, Manolis Kaliorakis, Sotiris Tselonis, Dimitris Gizopoulos
2017	A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.	Shravan K. Chaganti, Li Xu, Degang Chen
2017	Efficient SAT-based generation of hazard-activated TSOF tests.	Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
2017	At-speed capture global noise reduction & low-power memory test architecture.	Bonita Bhaskaran, Sailendra Chadalavada, Shantanu Sarangi, Nithin Valentine, Venkat Abilash Reddy Nerallapally, Ayub Abdollahian
2017	Keynote address: Opening keynote.	Ahmad Bahai
2016	Process variation oriented delay testing of SRAMs.	Xuan Zuo, Sandeep K. Gupta
2016	Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.	Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2016	Accurate spectral testing with non-coherent sampling for large distortion to noise ratios.	Yuming Zhuang, Degang Chen
2016	Path constraint solving based test generation for observability-enhanced branch coverage.	Yanhong Zhou, Huawei Li, Tiancheng Wang, Bo Liu, Yingke Gao, Xiaowei Li
2016	SRAM yield-per-area optimization under spatially-correlated process variation.	Jizhe Zhang, Sandeep K. Gupta
2016	Using hardware testing approaches to improve software testing: Undetectable mutant identification.	Jianwei Zhang, Sandeep K. Gupta
2016	Fault tolerance of approximate compute algorithms.	Hans-Joachim Wunderlich, Claus Braun, Alexander Schll
2016	A programmable method for low-power scan shift in SoC integrated circuits.	Ran Wang, Bonita Bhaskaran, Karthikeyan Natarajan, Ayub Abdollahian, Kaushik Narayanun, Krishnendu Chakrabarty, Amit Sanghani
2016	On-die learning-based self-calibration of analog/RF ICs.	Georgios Volanis, Dzmitry Maliuk, Yichuan Lu, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris
2016	Online soft-error vulnerability estimation for memory arrays.	Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2016	Security primitives (PUF and TRNG) with STT-MRAM.	Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Prinetto
2016	Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level.	Sotiris Tselonis, Manolis Kaliorakis, Nikos Foutris, George Papadimitriou, Dimitris Gizopoulos
2016	Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.	Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
2016	Test implications and challenges in near threshold computing special session.	Mehdi Baradaran Tahoori, Rob Aitken, Sriram R. Vangal, Bal Sandhu
2016	Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below.	Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker
2016	Revealing SRAM memory content using spontaneous photon emission.	Franco Stellari, Peilin Song, Manuel Villalobos, John Sylvestri
2016	Dynamic docking architecture for concurrent testing and peak power reduction.	Milind Sonawane, Pavan Kumar Datla Jagannadha, Sailendra Chadalavada, Shantanu Sarangi, Mahmut Yilmaz, Amit Sanghani, Karthikeyan Natarajan, Jonathon E. Colburn, Anubhav Sinha
2016	Flexible scan interface architecture for complex SoCs.	Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Amit Sanghani, Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Jonathon E. Colburn
2016	Consistency in wafer based outlier screening.	Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli

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