| 2016 | Security of emerging non-volatile memories: Attacks and defenses. | Kaveh Shamsi, Yier Jin |
| 2016 | Yield improvement of an EEPROM for automotive applications while maintaining high reliability. | Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson |
| 2016 | Effective generation and evaluation of diagnostic SBST programs. | Andreas Riefert, Riccardo Cantoro, Matthias Sauer, Matteo Sonza Reorda, Bernd Becker |
| 2016 | Special panel session IIB: "System validation and silicon debug - Is standardization possible?". | Mike Ricchetti, Eric Rentschler, Amit Majumdar, Mike Lowe, Mark LaVine, Skip Lindsey, Sharad Kumar |
| 2016 | Security validation in IoT space. | Sandip Ray, Swarup Bhunia, Yier Jin, Mark Tehranipoor |
| 2016 | Building trust in 3PIP using asset-based security property verification. | Juan Portillo, Eugene John, Seetharam Narasimhan |
| 2016 | A convergent procedure for partially-reachable states. | Irith Pomeranz |
| 2016 | Impact of crosstalk and process variation on capture power reduction for at-speed test. | Surya Piplani, G. S. Visweswaran, Anshul Kumar |
| 2016 | Fault tolerant approximate computing using emerging non-volatile spintronic memories. | Fabian Oboril, Azadeh Shirvanian, Mehdi Baradaran Tahoori |
| 2016 | Optimization of the IEEE 1687 access network for hybrid access schedules. | Srinivasa Shashank Nuthakki, Rajit Karmakar, Santanu Chattopadhyay, Krishnendu Chakrabarty |
| 2016 | Session 4B - Panel data analytics in semiconductor manufacturing. | Suriyaprakash Natarajan, Li-C. Wang |
| 2016 | Real-time DC motor error detection and control compensation using linear checksums. | Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee |
| 2016 | Lifetime reliability modeling and estimation in multi-core systems. | Antonio Miele |
| 2016 | Thwarting timing attacks on NEMS relay based designs. | Bodhisatwa Mazumdar, Samah Mohamed Saeed, Sk Subidh Ali, Ozgur Sinanoglu |
| 2016 | Test and diagnosis of paper-based microfluidic biochips. | Jain-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho |
| 2016 | Fault modeling and testing of resistive nonvolatile-8T SRAMs. | Yu-Ting Li, Yong-Xiao Chen, Jin-Fu Li |
| 2016 | Cache- and register-aware system reliability evaluation based on data lifetime analysis. | Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio |
| 2016 | ECC-ASPIRIN: An ECC-assisted post-package repair scheme for aging errors in DRAMs. | Dae Hyun Kim, Linda S. Milor |
| 2016 | Process independent gain measurement with low overhead via BIST/DUT co-design. | Jae Woong Jeong, Jennifer Kitchen, Sule Ozev |
| 2016 | Test-point insertion efficiency analysis for LBIST applications. | Miao Tony He, Gustavo K. Contreras, Mark Tehranipoor, Dat Tran, LeRoy Winemberg |
| 2016 | Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications. | Muhammad Ruhul Hasin, Jennifer Kitchen |
| 2016 | WeSPer: A flexible small delay defect quality metric. | Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault |
| 2016 | Introduction to approximate computing. | Jie Han |
| 2016 | Scalable parallel fault simulation for shared-memory multiprocessor systems. | Stavros Hadjitheophanous, Stelios N. Neophytou, Maria K. Michael |
| 2016 | Code-modulated embedded test for phased arrays. | Kevin Greene, Vikas Chauhan, Brian A. Floyd |