| 2016 | Active polymers for bio medical microdevices and microfluidic systems. | Bonnie Lynne Gray |
| 2016 | Faults in data prefetchers: Performance degradation and variability. | Nikos Foutris, Athanasios Chatzidimitriou, Dimitris Gizopoulos, John Kalamatianos, Vilas Sridharan |
| 2016 | Adaptive testing of analog/RF circuits using hardware extracted FSM models. | Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee |
| 2016 | Performance enhancement techniques and verification methods for radio frequency circuits and systems. | Hari Chauhan, Marvin Onabajo |
| 2016 | A novel technique for interdependent trim code optimization. | Pankaj Bongale, Vinothkumar Sundaresan, Partha Ghosh, Rubin A. Parekhji |
| 2016 | Runtime resource management for lifetime extension in multi-core systems. | Cristiana Bolchini |
| 2016 | Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. | Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman |
| 2016 | Lateral coupling faults in multi-ported register files and methods for their testing. | Dilip Bhavsar, Michael Lohmiller, Pankaj Pant |
| 2016 | Test method and scheme for low-power validation in modern SOC integrated circuits. | Bonita Bhaskaran, Amit Sanghani, Kaushik Narayanun, Ayub Abdollahian, Amit Laknaur |
| 2016 | Short burst software transparent on-line MBIST. | Alan Becker |
| 2016 | Infant mortality tests for analog and mixed-signal circuits. | Suvadeep Banerjee, Suriyaprakash Natarajan |
| 2016 | Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. | Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard |
| 2016 | Thermal issues in test: An overview of the significant aspects and industrial practice. | Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser |
| 2016 | Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. | Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | Robust counterfeit PCB detection exploiting intrinsic trace impedance variations. | Fengchao Zhang, Andrew Hennessy, Swarup Bhunia |
| 2015 | Random pattern generation for post-silicon validation of DDR3 SDRAM. | Hao-Yu Yang, Shih-Hua Kuo, Tzu-Hsuan Huang, Chi-Hung Chen, Chris Lin, Mango Chia-Tso Chao |
| 2015 | A low cost jitter separation and characterization method. | Li Xu, Yan Duan, Degang Chen |
| 2015 | ExTest scheduling for 2.5D system-on-chip integrated circuits. | Ran Wang, Guoliang Li, Rui Li, Jun Qian, Krishnendu Chakrabarty |
| 2015 | Low cost high frequency signal synthesis: Application to RF channel interference testing. | Xian Wang, Debashis Banerjee, Abhijit Chatterjee |
| 2015 | Innovative practices session 1C: New technologies, new challenges - 1 [3 presentations]. | Paul Tracey |
| 2015 | Foreword. | Claude Thibeault |
| 2015 | Keynote address: New opportunities in the internet of things. | Yankin Tanurhan |
| 2015 | At-Product-Test Dedicated Adaptive supply-resonance suppression. | Kohki Taniguchi, Noriyuki Miura, Taisuke Hayashi, Makoto Nagata |
| 2015 | Innovative practices session 2C: New technologies, new challenges - 2. | Suraj Sindia |
| 2015 | UPF-based formal verification of low power techniques in modern processors. | Reza Sharafinejad, Bijan Alizadeh, Masahiro Fujita |