| 2015 | A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs. | Mehdi Sadi, LeRoy Winemberg, Mark Tehranipoor |
| 2015 | Improving diagnosis resolution of a fault detection test set. | Andreas Riefert, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker |
| 2015 | Innovative practices session 3C: Advances in silicon debug & diagnosis. | Mike Ricchetti |
| 2015 | Improving accuracy of on-chip diagnosis via incremental learning. | Xuanle Ren, Mitchell Martin, Ronald D. Blanton |
| 2015 | Signature oriented model pruning to facilitate multi-threaded processors debugging. | Fatemeh Refan, Bijan Alizadeh, Zainalabedin Navabi |
| 2015 | Scalability study of PSANDE: Power supply analysis for noise and delay estimation. | Sushmita Kadiyala Rao, Bharath Shivashankar, Ryan W. Robucci, Nilanjan Banerjee, Chintan Patel |
| 2015 | Innovative practices session 11C: Advanced scan methodologies [3 presentations]. | Janusz Rajski, Nilanjan Mukherjee |
| 2015 | Special session 8C: E.J. McCluskey doctoral thesis award semi-final. | Michele Portolan, K. Huang |
| 2015 | A definition of the number of detections for faults with single tests in a compact scan-based test set. | Irith Pomeranz |
| 2015 | Test compaction by test cube merging for four-way bridging faults. | Irith Pomeranz |
| 2015 | Test vector omission with minimal sets of simulated faults. | Irith Pomeranz |
| 2015 | Improving the accuracy of defect diagnosis by considering reduced diagnostic information. | Irith Pomeranz |
| 2015 | Panel: Analog/RF BIST: Are we there yet? | Sule Ozev, Linda Milor |
| 2015 | Efficient built-in self test of regular logic characterization vehicles. | Ben Niewenhuis, Ronald D. Blanton |
| 2015 | Memory repair for high defect densities. | Michael Nicolaidis, Panagiota Papavramidou |
| 2015 | Innovative practices session 7C: Mixed signal test and debug. | Suriya Natarajan |
| 2015 | In-depth soft error vulnerability analysis using synthetic benchmarks. | Shahrzad Mirkhani, Balavinayagam Samynathan, Jacob A. Abraham |
| 2015 | No Fault Found: The root cause. | Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz |
| 2015 | Extracting effective functional tests from commercial programs. | Sreekumar Vadakke Kodakara, Mehul V. Sagar, Joel Yuen |
| 2015 | Special session 12B: Panel: IOT - Reliable? Secure? Or death by a billion cuts? | Sreekumar V. Kodakara, Suriya Natarajan |
| 2015 | MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. | Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor |
| 2015 | Testing of 3D-stacked ICs with hard- and soft-dies - a Particle Swarm Optimization based approach. | Rajit Karmakar, Aditya Agarwal, Santanu Chattopadhyay |
| 2015 | Rapid online fault recovery for cyber-physical digital microfluidic biochips. | Christopher Jaress, Philip Brisk, Daniel T. Grissom |
| 2015 | Fault diagnosis for flow-based microfluidic biochips. | Kai Hu, Bhargab B. Bhattacharya, Krishnendu Chakrabarty |
| 2015 | A multi-layered methodology for defect-tolerance of datapath modules in processors. | Hsunwei Hsiung, Sandeep K. Gupta |